Mathematical modeling of the deformation of composite plane with interface crack for semi-linear material
Domanskaya, Tatyana O., Malkov, Venyamin M., Malkova, Yulia V.
Published in Vestnik of Saint Petersburg University. Applied Mathematics. Computer Science. Control Processes (2018)
Published in Vestnik of Saint Petersburg University. Applied Mathematics. Computer Science. Control Processes (2018)
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Journal Article
Mathematical modeling of the deformation of composite plane with interface crack for John’s harmonic material
Domanskaya, Tatyana O., Malkov, Venyamin M., Malkova, Yulia V.
Published in Vestnik of Saint Petersburg University. Applied Mathematics. Computer Science. Control Processes (2017)
Published in Vestnik of Saint Petersburg University. Applied Mathematics. Computer Science. Control Processes (2017)
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Journal Article
Nonlinear deformation of plane with elastic elliptic inclusion for model of semi-linear material
Malkov, Venyamin, Malkova, Yulia
Published in 2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR) (01.10.2016)
Published in 2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR) (01.10.2016)
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Conference Proceeding
The state of stress of bi-material plate with an elliptic hole
Malkov, Venyamin, Malkova, Yulia
Published in 2015 International Conference on Mechanics - Seventh Polyakhov's Reading (01.02.2015)
Published in 2015 International Conference on Mechanics - Seventh Polyakhov's Reading (01.02.2015)
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Conference Proceeding
Deformation of bi-material plane with elliptic hole
Malkov, Venyamin, Malkova, Yulia
Published in 2014 2nd 2014 2nd International Conference on Emission Electronics (ICEE) (01.06.2014)
Published in 2014 2nd 2014 2nd International Conference on Emission Electronics (ICEE) (01.06.2014)
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Conference Proceeding
Singular problems for bi-material plane of John's harmonic material
Domanskaya, Tatyana, Malkov, Venyamin, Malkova, Yulia
Published in 2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR) (01.10.2016)
Published in 2016 Young Researchers in Vacuum Micro/Nano Electronics (VMNE-YR) (01.10.2016)
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Conference Proceeding