Refined extreme ultraviolet mask stack model
Makhotkin, I A, Wu, M, Soltwisch, V, Scholze, F, Philipsen, V
Published in Journal of the Optical Society of America. A, Optics, image science, and vision (01.04.2021)
Published in Journal of the Optical Society of America. A, Optics, image science, and vision (01.04.2021)
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Journal Article
Low-energy ion polishing of Si in W/Si soft X-ray multilayer structures
Medvedev, R. V., Nikolaev, K. V., Zameshin, A. A., IJpes, D., Makhotkin, I. A., Yakunin, S. N., Yakshin, A. E., Bijkerk, F.
Published in Journal of applied physics (28.07.2019)
Published in Journal of applied physics (28.07.2019)
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Journal Article
Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structures
Yakunin, S N, Makhotkin, I A, Nikolaev, K V, van de Kruijs, R W E, Chuev, M A, Bijkerk, F
Published in Optics express (25.08.2014)
Published in Optics express (25.08.2014)
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Journal Article
Surface structure determination by x-ray standing waves at a free-electron laser
Mercurio, G, Makhotkin, I A, Milov, I, Kim, Y Y, Zaluzhnyy, I A, Dziarzhytski, S, Wenthaus, L, Vartanyants, I A, Wurth, W
Published in New journal of physics (28.03.2019)
Published in New journal of physics (28.03.2019)
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A semi‐analytical approach for the characterization of ordered 3D nanostructures using grazing‐incidence X‐ray fluorescence
Nikolaev, K. V., Soltwisch, V., Hönicke, P., Scholze, F., de la Rie, J., Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Bijkerk, F.
Published in Journal of synchrotron radiation (01.03.2020)
Published in Journal of synchrotron radiation (01.03.2020)
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Journal Article
Determination the phase contact surface size of nitric acid with ammonia neutralization process for the ammonium nitrate production
Sakharov, I U, Makhotkin, A F, Sakharov, U N, Makhotkin, I A
Published in IOP conference series. Earth and environmental science (01.07.2021)
Published in IOP conference series. Earth and environmental science (01.07.2021)
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Journal Article
Grazing‐incidence small‐angle X‐ray scattering study of correlated lateral density fluctuations in W/Si multilayers
Nikolaev, K. V., Yakunin, S. N., Makhotkin, I. A., Rie, J. de la, Medvedev, R. V., Rogachev, A. V., Trunckin, I. N., Vasiliev, A. L., Hendrikx, C. P., Gateshki, M., Kruijs, R. W. E. van de, Bijkerk, F.
Published in Acta crystallographica. Section A, Foundations and advances (01.03.2019)
Published in Acta crystallographica. Section A, Foundations and advances (01.03.2019)
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Journal Article
Study of ultrathin Pt/Co/Pt trilayers modified by nanosecond XUV pulses from laser-driven plasma source
Jacyna, I., Klinger, D., Pełka, J.B., Minikayev, R., Dłużewski, P., Dynowska, E., Jakubowski, M., Klepka, M.T., Zymierska, D., Bartnik, A., Kurant, Z., Wolska, A., Wawro, A., Sveklo, I., Plaisier, J.R., Eichert, D., Brigidi, F., Makhotkin, I., Maziewski, A., Sobierajski, R.
Published in Journal of alloys and compounds (30.09.2018)
Published in Journal of alloys and compounds (30.09.2018)
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Journal Article
Specular reflection intensity modulated by grazing‐incidence diffraction in a wide angular range
Nikolaev, K. V., Makhotkin, I. A., Yakunin, S. N., Kruijs, R. W. E. van de, Chuev, M. A., Bijkerk, F.
Published in Acta crystallographica. Section A, Foundations and advances (01.09.2018)
Published in Acta crystallographica. Section A, Foundations and advances (01.09.2018)
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Journal Article
Determination of the density of ultrathin La films in La/B4C layered structures using X-ray standing waves
Makhotkin, I. A., Louis, E., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., Seregin, A. Yu, Tereschenko, E. Yu, Yakunin, S. N., Bijkerk, F.
Published in Physica status solidi. A, Applications and materials science (01.11.2011)
Published in Physica status solidi. A, Applications and materials science (01.11.2011)
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Journal Article
Two-level ablation and damage morphology of Ru films under femtosecond extreme UV irradiation
Milov, I., Zhakhovsky, V., Ilnitsky, D., Migdal, K., Khokhlov, V., Petrov, Yu, Inogamov, N., Lipp, V., Medvedev, N., Ziaja, B., Medvedev, V., Makhotkin, I.A., Louis, E., Bijkerk, F.
Published in Applied surface science (30.10.2020)
Published in Applied surface science (30.10.2020)
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Journal Article
Similarity in ruthenium damage induced by photons with different energies: From visible light to hard X-rays
Milov, I., Lipp, V., Ilnitsky, D., Medvedev, N., Migdal, K., Zhakhovsky, V., Khokhlov, V., Petrov, Yu, Inogamov, N., Semin, S., Kimel, A., Ziaja, B., Makhotkin, I.A., Louis, E., Bijkerk, F.
Published in Applied surface science (31.01.2020)
Published in Applied surface science (31.01.2020)
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Journal Article
A semi-analytical approach for the characterization of ordered 3D nano structures using grazing-incidence X-ray fluorescence
Nikolaev, K V, Soltwisch, V, Hoenicke, P, Scholze, F, de la Rie, J, Yakunin, S N, Makhotkin, I A, R W E van de Kruijs, Bijkerk, F
Published in arXiv.org (30.08.2019)
Published in arXiv.org (30.08.2019)
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Journal Article
Post deposition nitridation of Si in W/Si soft X-ray multilayer systems
Medvedev, R.V., Hendrikx, C.P., Sturm, J.M., Yakunin, S.N., Makhotkin, I.A., Yakshin, A.E., Bijkerk, F.
Published in Thin solid films (01.05.2021)
Published in Thin solid films (01.05.2021)
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Journal Article
Model independent X-ray standing wave analysis of periodic multilayer structures
Yakunin, S N, Makhotkin, I A, Chuev, M A, Pashaev, E M, Zoethout, E, Louis, E, R W E van de Kruijs, S Yu Seregin, Subbotin, I A, Novikov, D V, Bijkerk, F, Kovalchuk, M V
Published in arXiv.org (12.09.2013)
Published in arXiv.org (12.09.2013)
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Journal Article
Determination of the density of ultrathin La films in La/B 4 C layered structures using X‐ray standing waves
Makhotkin, I. A., Louis, E., van de Kruijs, R. W. E., Yakshin, A. E., Zoethout, E., Seregin, A. Yu, Tereschenko, E. Yu, Yakunin, S. N., Bijkerk, F.
Published in Physica status solidi. A, Applications and materials science (01.11.2011)
Published in Physica status solidi. A, Applications and materials science (01.11.2011)
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Journal Article
Determination of preferential molecular orientation in porphyrin-fullerene dyad ZnDHD6ee monolayers by the X-ray standing-wave method and X-ray reflectometry
Seregin, A. Yu, D’yakova, Yu. A., Yakunin, S. N., Makhotkin, I. A., Alekseev, A. S., Klechkovskaya, V. V., Tereschenko, E. Yu, Tkachenko, N. V., Lemmetyinen, H., Feigin, L. A., Kovalchuk, M. V.
Published in Crystallography reports (01.11.2013)
Published in Crystallography reports (01.11.2013)
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Journal Article
Determination of the density of ultrathin La films in La/B4C layered structures using X-ray standing waves : High-resolution X-ray Diffraction and Imaging
MAKHOTKIN, I. A, LOUIS, E, VAN DE KRUIJS, R. W. E, YAKSHIN, A. E, ZOETHOUT, E, SEREGIN, A. Yu, TERESCHENKO, E. Yu, YAKUNIN, S. N, BIJKERK, F
Published in Physica status solidi. A, Applications and materials science (2011)
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Published in Physica status solidi. A, Applications and materials science (2011)
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