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Published in Nanomaterials (Basel, Switzerland) (29.03.2022)
Published in Nanomaterials (Basel, Switzerland) (29.03.2022)
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Published in ACS applied materials & interfaces (17.01.2024)
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An Improved STEM/EDX Quantitative Method for Dopant Profiling at the Nanoscale
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Published in Microscopy and microanalysis (01.02.2020)
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