First nosocomial cluster of COVID-19 due to the Delta variant in a major acute care hospital in Singapore: investigations and outbreak response
Lim, W-Y., Tan, G.S.E., Htun, H.L., Phua, H.P., Kyaw, W.M., Guo, H., Cui, L., Mak, T.M., Poh, B.F., Wong, J.C.C., Setoh, Y.X., Ang, B.S.P., Chow, A.L.P.
Published in The Journal of hospital infection (01.04.2022)
Published in The Journal of hospital infection (01.04.2022)
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Journal Article
Effective use of Reconfigurable Synthetic Instruments in Automatic Testing of Input/Output (I/O) Buses
Ungar, Louis Y., Jacobson, Neil G., Mak, T.M., Stoldt, Craig D.
Published in 2022 IEEE AUTOTESTCON (29.08.2022)
Published in 2022 IEEE AUTOTESTCON (29.08.2022)
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Conference Proceeding
Implications of clock distribution faults and issues with screening them during manufacturing testing
Metra, C., Di Francescantonio, S., Mak, T.M.
Published in IEEE transactions on computers (01.05.2004)
Published in IEEE transactions on computers (01.05.2004)
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Journal Article
VLSI Test Principles and Architectures
Khader S. Abdel-Hafez, Soumendu Bhattacharya, Abhijit Chatterjee, Xinghao Chen, Kwang-Ting Cheng, William Eklow, Michael S. Hsiao, Jiun-Lang Huang, Shi-Yu Huang, Wen-Ben Jone, Rohit Kapur, Brion Keller, Kuen-Jong Lee, James C.-M. Li, Mike Peng Li, Xiaowei Li, T.M. Mak, Yinghua Min, Benoit Nadeau-Dostie, Mehrdad Nourani, Janusz Rajski, Charles Stroud, Nur A. Touba, Erik H. Volkerink, Duncan Walker, Laung-Terng Wang, Xiaoqing Wen, Cheng-Wen Wu, Shianling Wu
Year of Publication 14.08.2006
Year of Publication 14.08.2006
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eBook
Sequential Element Design With Built-In Soft Error Resilience
Ming Zhang, Mitra, S., Mak, T.M., Seifert, N., Wang, N.J., Quan Shi, Kee Sup Kim, Shanbhag, N.R., Patel, S.J.
Published in IEEE transactions on very large scale integration (VLSI) systems (01.12.2006)
Published in IEEE transactions on very large scale integration (VLSI) systems (01.12.2006)
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Journal Article
New challenges in delay testing of nanometer, multigigahertz designs
Mak, T.M., Krstic, A., Cheng, K.-T., Wang, Li.-C.
Published in IEEE design & test of computers (01.05.2004)
Published in IEEE design & test of computers (01.05.2004)
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Journal Article
Built-In Soft Error Resilience for Robust System Design
Mitra, S., Ming Zhang, Seifert, N., Mak, T.M., Kee Sup Kim
Published in 2007 IEEE International Conference on Integrated Circuit Design and Technology (01.05.2007)
Published in 2007 IEEE International Conference on Integrated Circuit Design and Technology (01.05.2007)
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Conference Proceeding
Novel On-Chip Clock Jitter Measurement Scheme for High Performance Microprocessors
Metra, C., Omana, M., Mak, T.M., Rahman, A., Tam, S.
Published in 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems (01.10.2008)
Published in 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems (01.10.2008)
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Conference Proceeding