Data Quality: Some Comments on the NASA Software Defect Datasets
Shepperd, M., Qinbao Song, Zhongbin Sun, Mair, C.
Published in IEEE transactions on software engineering (01.09.2013)
Published in IEEE transactions on software engineering (01.09.2013)
Get full text
Journal Article
Detecting uncertainty, predicting outcome for first year students
Sanders, Lalage Dorothy, Mair, Carolyn, James, Rachael
Published in Journal of applied research in higher education (04.07.2016)
Published in Journal of applied research in higher education (04.07.2016)
Get full text
Journal Article
Software defect association mining and defect correction effort prediction
Qinbao Song, Shepperd, M., Cartwright, M., Mair, C.
Published in IEEE transactions on software engineering (01.02.2006)
Published in IEEE transactions on software engineering (01.02.2006)
Get full text
Journal Article
An investigation of machine learning based prediction systems
Mair, Carolyn, Kadoda, Gada, Lefley, Martin, Phalp, Keith, Schofield, Chris, Shepperd, Martin, Webster, Steve
Published in The Journal of systems and software (15.07.2000)
Published in The Journal of systems and software (15.07.2000)
Get full text
Journal Article
Software Defect Association Mining and Defect Correction Effort Prediction
Song, Qinbao, Shepperd, Martin, Cartwright, Michelle, Mair, Carolyn
Published in IEEE transactions on software engineering (01.02.2006)
Published in IEEE transactions on software engineering (01.02.2006)
Get full text
Journal Article
An Empirical Study of Software Project Managers Using a Case-Based Reasoner
Mair, C., Martincova, M., Shepperd, M.
Published in 2012 45th Hawaii International Conference on System Sciences (01.01.2012)
Published in 2012 45th Hawaii International Conference on System Sciences (01.01.2012)
Get full text
Conference Proceeding
Using grey relational analysis to predict software effort with small data sets
Qinbao Song, Shepperd, M., Mair, C.
Published in 11th IEEE International Software Metrics Symposium (METRICS'05) (2005)
Published in 11th IEEE International Software Metrics Symposium (METRICS'05) (2005)
Get full text
Conference Proceeding