by Someya, Teruki, Mahfuzul Islam, A. K. M., Sakurai, Takayasu, Takamiya, Makoto
Published in IEEE journal of solid-state circuits (01.03.2019)

by Mahfuzul Islam, A. K. M., Hamamatsu, Masamune, Yokota, Tomoyuki, Sunghoon Lee, Yukita, Wakako, Takamiya, Makoto, Someya, Takao, Sakurai, Takayasu
Published in IEEE journal on emerging and selected topics in circuits and systems (01.03.2017)

by Mahfuzul Islam, A. K. M., Shiomi, Jun, Ishihara, Tohru, Onodera, Hidetoshi
Published in IEEE journal of solid-state circuits (01.11.2015)

by Someya, Teruki, Islam, A. K. M. Mahfuzul, Okada, Kenichi
Published in IEEE solid-state circuits letters (2020)

by Yamasaki, Hiromu, Miyazaki, Koutaro, Lo, Yang, Mahfuzul Islam, A. K. M., Hata, Katsuhiro, Sakurai, Takayasu, Takamiya, Makoto
Published in 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (23.09.2020)

by Islam, A. K. M. Mahfuzul, Onodera, Hidetoshi
Published in Japanese Journal of Applied Physics (01.04.2014)

by Tashiro, Daiki, Sameshima, Kana, Hisakado, Takashi, Islam, A. K. M. Mahfuzul, Wada, Osami
Published in IEEE transactions on electromagnetic compatibility (01.10.2023)

by Mahfuzul Islam, A. K. M., Nakai, Tatsuya, Onodera, Hidetoshi
Published in IEEE transactions on semiconductor manufacturing (01.08.2017)

by Mahfuzul, Islam A. K. M., Tsuchiya, Akira, Kobayashi, Kazutoshi, Onodera, Hidetoshi
Published in IEEE transactions on semiconductor manufacturing (01.11.2012)

by Fujimoto, Shuuichi, Islam, A. K. M. Mahfuzul, Matsumoto, Takashi, Onodera, Hidetoshi
Published in IEEE transactions on semiconductor manufacturing (01.08.2013)

by Miyazaki, Koutaro, Lo, Yang, Mahfuzul Islam, A. K. M., Hata, Katsuhiro, Takamiya, Makoto, Sakurai, Takayasu
Published in 2019 International Conference on IC Design and Technology (ICICDT) (01.06.2019)

by Mahfuzul Islam, A. K. M., Onodera, Hidetoshi
Published in Proceedings of the 2015 International Conference on Microelectronic Test Structures (01.03.2015)

by Mahfuzul Islam, A. K. M., Nakai, Tatsuya, Onodera, Hidetoshi
Published in 2016 International Conference on Microelectronic Test Structures (ICMTS) (01.03.2016)

by Mahfuzul Islam, A. K. M., Onodera, Hidetoshi
Published in 2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC) (01.01.2016)

by Kamae, Norihiro, Mahfuzul Islam, A. K. M., Tsuchiya, Akira, Ishihara, Tohru, Onodera, Hidetoshi
Published in Sixteenth International Symposium on Quality Electronic Design (01.03.2015)

by Islam, A.K.M. Mahfuzul, Onodera, Hidetoshi
Published in 2018 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) (01.11.2018)

by Mahfuzul Islam, A.K.M., Shimizu, Ryota, Onodera, Hidetoshi
Published in 2019 IEEE International Reliability Physics Symposium (IRPS) (01.03.2019)

by Udo, Misaki, Murakami, Kensuke, Islam, A.K.M. Mahfuzul, Onodera, Hidetoshi
Published in 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS) (01.05.2020)

by Saha, Swapnil Sayan, Rahman, Shafizur, Rasna, Miftahul Jannat, Zahid, Tarek Bin, Islam, A.K.M. Mahfuzul, Ahad, Md. Atiqur Rahman
Published in IEEE access (01.01.2018)

by ISLAM, A. K. M. Mahfuzul, ONODERA, Hidetoshi
Published in IEICE transactions on information and systems (2013)