Unlocking the performance of next-generation non-volatile capacitive memory devices with Ti-doped ZnO nano wires via pulsed laser deposition
Nath, Amitabha, Mishra, Madhuri, Mahajan, Bikram Kishore, Chakrabarti, Subhananda
Published in Journal of alloys and compounds (05.01.2025)
Published in Journal of alloys and compounds (05.01.2025)
Get full text
Journal Article
A Device-to-System Perspective Regarding Self-Heating Enhanced Hot Carrier Degradation in Modern Field-Effect Transistors: A Topical Review
Alam, Muhammad Ashraful, Mahajan, Bikram Kishore, Chen, Yen-Pu, Ahn, Woojin, Jiang, Hai, Shin, Sang Hoon
Published in IEEE transactions on electron devices (01.11.2019)
Published in IEEE transactions on electron devices (01.11.2019)
Get full text
Journal Article
Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In 2 O 3 Thin-Film Transistors
Chen, Yen-Pu, Si, Mengwei, Mahajan, Bikram Kishore, Lin, Zehao, Ye, Peide D., Alam, Muhammad Ashraful
Published in IEEE electron device letters (01.02.2022)
Published in IEEE electron device letters (01.02.2022)
Get full text
Journal Article
Positive Bias Temperature Instability and Hot Carrier Degradation of Back-End-of-Line, nm-Thick, In2O3 Thin-Film Transistors
Chen, Yen-Pu, Si, Mengwei, Mahajan, Bikram Kishore, Lin, Zehao, Ye, Peide D., Alam, Muhammad Ashraful
Published in IEEE electron device letters (01.02.2022)
Published in IEEE electron device letters (01.02.2022)
Get full text
Journal Article
Enhancing Detectivity of Indium-Oxide-Based Photodetectors via Vertical Nanostructuring Through Glancing Angle Deposition
Nath, Amitabha, Mahajan, Bikram Kishore, Singh, Laishram Robindro, Vishwas, Shubhajit, Nanda, Rajib Kumar, Sarkar, Mitra Barun
Published in Journal of electronic materials (01.06.2021)
Published in Journal of electronic materials (01.06.2021)
Get full text
Journal Article
Aerosol printing and photonic sintering of bioresorbable zinc nanoparticle ink for transient electronics manufacturing
Mahajan, Bikram Kishore, Ludwig, Brandon, Shou, Wan, Yu, Xiaowei, Fregene, Emmanuel, Xu, Hang, Pan, Heng, Huang, Xian
Published in Science China. Information sciences (01.07.2018)
Published in Science China. Information sciences (01.07.2018)
Get full text
Journal Article
Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors
Mahajan, Bikram Kishore, Chen, Yen-Pu, Rivera, Ulisses Alberto Heredia, Rahimi, Rahim, Alam, Muhammad Ashraful
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Get full text
Conference Proceeding
A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors
Mahajan, Bikram Kishore, Chen, Yen-Pu, Alam, Muhammad Ashraful, Varghese, Dhanoop, Krishnan, Srikanth, Reddy, Vijay
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Published in 2022 IEEE International Reliability Physics Symposium (IRPS) (01.03.2022)
Get full text
Conference Proceeding
Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique
Mahajan, Bikram Kishore, Chen, Yen-Pu, Varghese, Dhanoop, Reddy, Vijay, Krishnan, Srikanth, Alam, Muhammad Ashraful
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Published in 2021 IEEE International Reliability Physics Symposium (IRPS) (01.03.2021)
Get full text
Conference Proceeding
A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors
Chen, Yen-Pu, Mahajan, Bikram Kishore, Varghese, Dhanoop, Krishnan, Srikanth, Reddy, Vijay, Alam, Muhammad Ashraful
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Published in 2020 IEEE International Reliability Physics Symposium (IRPS) (01.04.2020)
Get full text
Conference Proceeding