Defectivity of Al:ZnO thin films with different crystalline order probed by Positron Annihilation Spectroscopy
Magrin Maffei, R., Butterling, M., Liedke, M.O., D’Addato, S., di Bona, A., Bertoni, G., Gazzadi, G.C., Mariazzi, S., Wagner, A., Brusa, R.S., Benedetti, S.
Published in Applied surface science (30.08.2024)
Published in Applied surface science (30.08.2024)
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