Reverse Fuzzy Extractors: Enabling Lightweight Mutual Authentication for PUF-Enabled RFIDs
Van Herrewege, Anthony, Katzenbeisser, Stefan, Maes, Roel, Peeters, Roel, Sadeghi, Ahmad-Reza, Verbauwhede, Ingrid, Wachsmann, Christian
Published in Financial Cryptography and Data Security
Published in Financial Cryptography and Data Security
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Book Chapter
Long-term Continuous Assessment of SRAM PUF and Source of Random Numbers
Wang, Rui, Selimis, Georgios, Maes, Roel, Goossens, Sven
Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2020)
Published in 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) (01.03.2020)
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Conference Proceeding
Secure key generation from biased PUFs: extended version
Maes, Roel, van der Leest, Vincent, van der Sluis, Erik, Willems, Frans
Published in Journal of cryptographic engineering (01.06.2016)
Published in Journal of cryptographic engineering (01.06.2016)
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Journal Article
Intelligent Voltage Ramp-Up Time Adaptation for Temperature Noise Reduction on Memory-Based PUF Systems
Cortez, Mafalda, Hamdioui, Said, Kaichouhi, Ali, van der Leest, Vincent, Maes, Roel, Schrijen, Geert-Jan
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2015)
Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.07.2015)
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Journal Article
Experimental evaluation of Physically Unclonable Functions in 65 nm CMOS
Maes, R., Rozic, V., Verbauwhede, I., Koeberl, P., van der Sluis, E., van der Leest, Vincent
Published in 2012 Proceedings of the ESSCIRC (ESSCIRC) (01.09.2012)
Published in 2012 Proceedings of the ESSCIRC (ESSCIRC) (01.09.2012)
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Conference Proceeding
CRYPTOGRAPHIC KEY PRODUCTION FROM A PHYSICAL UNCLONABLE FUNCTION
VAN DER LEEST VINCENT, WILLEMS FRANCISCUS MARIA JOANNES, VAN DER SLUIS ERIK, MAES ROEL
Year of Publication 04.09.2017
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Year of Publication 04.09.2017
Patent
A practical device authentication scheme using SRAM PUFs
Koeberl, Patrick, Li, Jiangtao, Maes, Roel, Rajan, Anand, Vishik, Claire, Wójcik, Marcin, Wu, Wei
Published in Journal of cryptographic engineering (01.11.2012)
Published in Journal of cryptographic engineering (01.11.2012)
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Journal Article
Countering the effects of silicon aging on SRAM PUFs
Maes, Roel, van der Leest, Vincent
Published in 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) (01.05.2014)
Published in 2014 IEEE International Symposium on Hardware-Oriented Security and Trust (HOST) (01.05.2014)
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Conference Proceeding
Modeling and Analysis of SRAM PUF Bias Patterns in 14nm and 7nm FinFET Technology Nodes
Masoumian, Shayesteh, Maes, Roel, Wang, Rui, Yerriswamy, Karthik Keni, Schrijen, Geert-Jan, Hamdioui, Said, Taouil, Mottaqiallah
Published in 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC) (16.10.2023)
Published in 2023 IFIP/IEEE 31st International Conference on Very Large Scale Integration (VLSI-SoC) (16.10.2023)
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Conference Proceeding