by Maconi, Alessandro, Compagnoni, Christian Monzio, Amoroso, Salvatore M, Mascellino, Evelyne, Ghidotti, Michele, Padovini, Giorgio, Spinelli, Alessandro S, Lacaita, Andrea L, Mauri, Aurelio, Ghidini, Gabriella, Galbiati, Nadia, Sebastiani, Alessandro, Scozzari, Claudia, Greco, Eugenio, Camozzi, Elisa, Tessariol, Paolo
Published in 2010 Proceedings of the European Solid State Device Research Conference (01.09.2010)

by Amoroso, S. M., Monzio Compagnoni, Christian, Mauri, A., Maconi, A., Spinelli, A. S., Lacaita, A. L.
Published in IEEE transactions on electron devices (01.09.2011)

by Amoroso, S M, Maconi, A, Mauri, A, Compagnoni, Christian Monzio, Spinelli, A S, Lacaita, A L
Published in IEEE transactions on electron devices (01.07.2011)

by Mauri, A, Compagnoni, Christian Monzio, Amoroso, S M, Maconi, A, Ghetti, A, Spinelli, A S, Lacaita, A L
Published in IEEE transactions on electron devices (01.09.2010)

by Maconi, A., Compagnoni, C. M., Spinelli, A. S., Lacaita, A. L.
Published in IEEE transactions on electron devices (01.07.2013)

by Spinelli, A. S., Monzio Compagnoni, Christian, Maconi, A., Amoroso, S. M., Lacaita, A. L.
Published in IEEE transactions on electron devices (01.07.2012)

by Compagnoni, C.M., Mauri, A., Amoroso, S.M., Maconi, A., Spinelli, A.S.
Published in IEEE transactions on electron devices (01.09.2009)

by Maconi, A, Amoroso, S M, Compagnoni, C M, Mauri, A, Spinelli, A S, Lacaita, A L
Published in IEEE transactions on electron devices (01.07.2011)

by Monzio Compagnoni, C, Mauri, A, Amoroso, S M, Maconi, A, Greco, E, Spinelli, A S, Lacaita, A L
Published in IEEE transactions on electron devices (01.09.2010)

by Mauri, Aurelio, Amoroso, Salvatore M., Monzio Compagnoni, Christian, Maconi, Alessandro, Spinelli, Alessandro S.
Published in Solid-state electronics (01.02.2011)

by Amoroso, S M, Mauri, A, Galbiati, N, Scozzari, C, Mascellino, E, Camozzi, E, Rangoni, A, Ghilardi, T, Grossi, A, Tessariol, P, Compagnoni, C M, Maconi, A, Lacaita, A L, Spinelli, A S, Ghidini, G
Published in 2010 IEEE International Reliability Physics Symposium (01.05.2010)