A Multi-Time-Step Finite Element Algorithm for 3-D Simulation of Coupled Drift-Diffusion Reaction Process in Total Ionizing Dose Effect
Xu, Jingjie, Ma, Zhaocan, Li, Hongliang, Song, Yu, Zhang, Linbo, Lu, Benzhuo
Published in IEEE transactions on semiconductor manufacturing (01.02.2018)
Published in IEEE transactions on semiconductor manufacturing (01.02.2018)
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Journal Article
Simulation of the Total Ionization Dose Effect of Gate-Controlled Lateral PNP Bipolar Transistors
Ma, Zhaocan, Li, Guangrong, Zhao, Zhenguo, Wang, Weijie
Published in 2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED) (26.05.2021)
Published in 2021 4th International Conference on Radiation Effects of Electronic Devices (ICREED) (26.05.2021)
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Conference Proceeding