Statistical Noise Analysis of CMOS Image Sensors in Dark Condition
Woo, Jun-Myung, Park, Hong-Hyun, Hong, Sung-Min, Chung, In-Young, Min, Hong Shick, Park, Young June
Published in IEEE transactions on electron devices (01.11.2009)
Published in IEEE transactions on electron devices (01.11.2009)
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Journal Article
Electrical Characteristics of the Concentric-Shape Carbon Nanotube Network Device in pH Buffer Solution
Cheon, Jun Ho, Lim, Jaeheung, Seo, Sung Min, Woo, Jun-Myung, Kim, Seok Hyang, Kwon, Yongjoo, Ko, Jung Woo, Kang, Tae June, Kim, Yong Hyup, Park, Young June
Published in IEEE transactions on electron devices (01.10.2010)
Published in IEEE transactions on electron devices (01.10.2010)
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Journal Article
Multi-Order Dynamic Range DNA Sensor Using a Gold Decorated SWCNT Random Network
Ko, Jung Woo, Woo, Jun-Myung, Jinhong, Ahn, Cheon, Jun Ho, Lim, Jae Heung, Kim, Seok Hyang, Chun, Honggu, Kim, Eunhye, Park, Young June
Published in ACS nano (28.06.2011)
Published in ACS nano (28.06.2011)
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Journal Article
Comparative analysis of electrical detection methods of DNA synthesis
Ahn, Jinhong, Kim, Seok Hyang, Woo, Jun-Myung, Park, Young June
Published in Journal of nanoscience and nanotechnology (01.07.2012)
Published in Journal of nanoscience and nanotechnology (01.07.2012)
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Journal Article
Statistical analysis of random telegraph noise in CMOS image sensors
Jun-Myung Woo, Hong-Hyun Park, Hong Shick Min, Young June Park, Sung-Min Hong, Chan Hyeong Park
Published in 2008 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2008)
Published in 2008 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2008)
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Conference Proceeding
A unified approach for the reliability modeling of MOSFETs
Chang-Ki Baek, SeongWook Choi, Hong-Hyun Park, Jun-Myung Woo, Young June Park, Sung-Min Hong, Chan Hyeong Park
Published in 2008 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2008)
Published in 2008 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2008)
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Conference Proceeding