Charge trapping characterization in the thin oxide layer/non-conductive substrate system
Liebault, J., Moya-Siesse, D., Bernardini, J., Moya, G.
Published in Surface and interface analysis (01.08.2002)
Published in Surface and interface analysis (01.08.2002)
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Journal Article
Conference Proceeding
Determination of the electron beam irradiated area by using a charging effect in oxide surfaces
Zarbout, K., Moya-Siesse, D., Moya, G., Kallel, A.
Published in Journal of non-crystalline solids (15.07.2005)
Published in Journal of non-crystalline solids (15.07.2005)
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Journal Article
Conference Proceeding
New technique to characterise thin oxide films under electronic irradiation
Liébault, J., Zarbout, K., Moya-Siesse, D., Bernardini, J., Moya, G.
Published in Applied surface science (15.05.2003)
Published in Applied surface science (15.05.2003)
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Journal Article
Specific heat of solid dielectrics charged at room temperature
Moya, G., Moya-Siesse, D., Blaise, G.
Published in 10th International Symposium on Electrets (ISE 10). Proceedings (Cat. No.99 CH36256) (1999)
Published in 10th International Symposium on Electrets (ISE 10). Proceedings (Cat. No.99 CH36256) (1999)
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Conference Proceeding
Sapphire characterization by positron annihilation measurement
Li, X H, Moya-Siesse, D, Salhi, F, Moya, G
Published in Materials for Advanced Metallization (MAM), European Workshop (29.06.1998)
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Published in Materials for Advanced Metallization (MAM), European Workshop (29.06.1998)
Journal Article
New technique to characterise thin oxide films under electronic irradiation
LIEBAULT, J, ZARBOUT, K, MOYA-SIESSE, D, BERNARDINI, J, MOYA, G
Published in Applied surface science (2003)
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Published in Applied surface science (2003)
Conference Proceeding
Dopant effect on trapping charge properties studied by the mirror method correlated with C/sub p/ measurement
Moya-Siesse, D., Sami, A., Moya, G., Le Gressus, C.
Published in Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP'94) (1994)
Published in Proceedings of IEEE Conference on Electrical Insulation and Dielectric Phenomena - (CEIDP'94) (1994)
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Conference Proceeding