off-State Degradation in Drain-Extended NMOS Transistors: Interface Damage and Correlation to Dielectric Breakdown
Varghese, D., Kufluoglu, H., Reddy, V., Shichijo, H., Mosher, D., Krishnan, S., Muhammad Ashraful Alam
Published in IEEE transactions on electron devices (01.10.2007)
Published in IEEE transactions on electron devices (01.10.2007)
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Journal Article
High-voltage drain extended MOS transistors for 0.18-μm logic CMOS process
Mitros, J.C., Chin-Yu Tsai, Shichijo, H., Kunz, M., Morton, A., Goodpaster, D., Mosher, D., Efland, T.R.
Published in IEEE transactions on electron devices (01.08.2001)
Published in IEEE transactions on electron devices (01.08.2001)
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Journal Article
Ethical Perceptions of Entrepreneurial Tricks
Pivoda, Miroslav, Mosher, Dan, Hoy, Frank, McNicol, Jason P
Published in ICSB World Conference Proceedings (01.01.2008)
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Published in ICSB World Conference Proceedings (01.01.2008)
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