by Bordignon, Thomas, Duriez, Blandine, Guitard, Nicolas, Duru, Romain, Pribat, Clément, Richy, Jérôme, Reboh, Shay, Dhar, Siddhartha, Monsieur, Frédéric, Fache, Thibaud, Chalupa, Zdenek, Hartmann, Jean-Michel, Chevalier, Pascal, Roelens, Yannick, Danneville, François, Crémer, Sébastien
Published in Solid-state electronics (01.12.2023)

by Martinez, V., Besset, C., Monsieur, F., Montes, L., Ghibaudo, G.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)

by Diop, M., Revil, N., Marin, M., Monsieur, F., Schwartzmann, T., Ghibaudo, G.
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)

by Garegnani, Giacomo, Fiori, Vincent, Gouget, Gilles, Monsieur, Frederic, Tavernier, Clement
Published in Microelectronics and reliability (01.08.2016)

by Joblot, Sylvain, Duru, Romain, Guitard, Nicolas, Lu, Vincent, Nassiet, Thomas, Beneyton, Remi, Cristiano, Fuccio, Dabertrand, Karen, Borrel, Julien, Juhel, Marc, Arevalo, Edwin, Monsieur, Frederic, Borowiak, Celine, Ghegin, Elodie, Clement, Laurent, Oudot, Evan, Rideau, Denis, Zou, Wei, Pinzelli, Luc
Published in 2018 22nd International Conference on Ion Implantation Technology (IIT) (01.09.2018)

by Garba-Seybou, Tidjani, Federspiel, Xavier, Monsieur, Frederic, Sicre, Mathieu, Cacho, Florian, Hai, Joycelyn, Bravaix, Alain
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)

by El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, André, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)

by Palma, Fabrizio, Logoteta, Demetrio, Centurelli, Francesco, Chevalier, Pascal, Cicchetti, Renato, Monsieur, Frederic, Santini, Carlo, Testa, Orlandino, Trifiletti, Alessandro, d’Alessandro, Antonio
Published in Electronics (Basel) (01.08.2024)

by El Ghouli, Salim, Rideau, Denis, Monsieur, Frederic, Scheer, Patrick, Gouget, Gilles, Juge, Andre, Poiroux, Thierry, Sallese, Jean-Michel, Lallement, Christophe
Published in IEEE transactions on electron devices (01.01.2018)

by Bordignon, Thomas, Lucci, Luca, Fache, Thibaud, Pribat, Clement, Gregoire, Magali, Estellon, Adrien, Monsieur, Frederic, Guitard, Nicolas, Chalupa, Zdenek, Chevalier, Pascal, Duriez, Blandine, Roelens, Yannick, Danneville, Francois, Cremer, Sebastien
Published in 2024 IEEE European Solid-State Electronics Research Conference (ESSERC) (09.09.2024)

by Cros, Antoine, Monsieur, Frederic, Carminati, Yann, Normandon, Philippe, Petit, David, Arnaud, Franck, Rosa, Julien
Published in Proceedings of the 2015 International Conference on Microelectronic Test Structures (01.03.2015)

by MONSIEUR, Frederic
Year of Publication 20.06.2024

by Julliard, Pierre-Louis, Jay, Antoine, Gunde, Miha, Salles, Nicolas, Monsieur, Frederic, Guitard, Nicolas, Cabout, Thomas, Joblot, Sylvain, Martin-Samos, Layla, Rideau, Denis, Cristiano, Fuccio, Hemeryck, Anne
Published in 2021 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2021)

by MONSIEUR, Frederic
Year of Publication 21.06.2024

by Federspiel, Xavier, Arfaoui, Wafa, Angot, Damien, Monsieur, Frederic, Rafik, Mustapha, Mora, Pascal, Cacho, Florian, Roy, David, Huard, Vincent
Published in ECS transactions (26.03.2014)

by Soon-Cheon Seo, Chih-Chao Yang, Miaomiao Wang, Monsieur, Frederic, Adam, Lahir, Johnson, Jeffrey B, Horak, Dave, Fan, Susan, Kangguo Cheng, Stathis, James, Doris, Bruce
Published in IEEE electron device letters (01.12.2010)

by Lopez, Diana, Monsieur, Frederic, Balestra, Francis
Published in 2008 IEEE International Integrated Reliability Workshop Final Report (01.10.2008)

by HAENDLER, Sebastien, MONSIEUR, Frederic, CREMER, Sebastien, FLEURY, Alain
Year of Publication 14.09.2023

by Hook, T. B., Furkay, S., Kulkarni, P., Monsieur, F.
Published in IEEE 2011 International SOI Conference (01.10.2011)

by Monsieur, F, Cartier, E, Stathis, J
Published in 2011 International Reliability Physics Symposium (01.04.2011)