Novel ZrInZnO Thin-film Transistor with Excellent Stability
Park, Jin-Seong, Kim, KwangSuk, Park, Yong-Gil, Mo, Yeon-Gon, Kim, Hye Dong, Jeong, Jae Kyeong
Published in Advanced materials (Weinheim) (19.01.2009)
Published in Advanced materials (Weinheim) (19.01.2009)
Get full text
Journal Article
Role of incorporated hydrogen on performance and photo-bias instability of indium gallium zinc oxide thin film transistors
Kim, Hyo Jin, Park, Se Yeob, Jung, Hong Yoon, Son, Byeong Geun, Lee, Chang-Kyu, Lee, Chul-Kyu, Jeong, Jong Han, Mo, Yeon-Gon, Son, Kyoung Seok, Ryu, Myung Kwan, Lee, Sangyoon, Jeong, Jae Kyeong
Published in Journal of physics. D, Applied physics (06.02.2013)
Published in Journal of physics. D, Applied physics (06.02.2013)
Get full text
Journal Article
The Effect of Density-of-State on the Temperature and Gate Bias-Induced Instability of InGaZnO Thin Film Transistors
Ji, Kwang Hwan, Kim, Ji-In, Jung, Hong Yoon, Park, Se Yeob, Mo, Yeon-Gon, Jeong, Jong Han, Kwon, Jang-Yeon, Ryu, Myung-Kwan, Lee, Sang Yoon, Choi, Rino, Jeong, Jae Kyeong
Published in Journal of the Electrochemical Society (2010)
Published in Journal of the Electrochemical Society (2010)
Get full text
Journal Article
Active-matrix OLED on bendable metal foil
Jun Hyuk Cheon, Jong Hyun Choi, Ji Ho Hur, Jang, J., Hyun Soo Shin, Jae Kyeong Jeong, Yeon Gon Mo, Ho Kyoon Chung
Published in IEEE transactions on electron devices (01.05.2006)
Published in IEEE transactions on electron devices (01.05.2006)
Get full text
Journal Article
Meyer--Neldel Rule and Extraction of Density of States in Amorphous Indium--Gallium--Zinc-Oxide Thin-Film Transistor by Considering Surface Band Bending
Jeong, Jaewook, Jeong, Jae Kyeong, Park, Jin-Seong, Mo, Yeon-Gon, Hong, Yongtaek
Published in Japanese Journal of Applied Physics (01.03.2010)
Published in Japanese Journal of Applied Physics (01.03.2010)
Get full text
Journal Article
Flexible Full-Color AMOLED on Ultrathin Metal Foil
Jeong, Jae Kyeong, Jin, Dong Un, Shin, Hyun Soo, Lee, Hun Jung, Kim, Minkyu, Ahn, Tae Kyung, Lee, Jaeseob, Mo, Yeon Gon, Chung, Ho Kyun
Published in IEEE electron device letters (01.05.2007)
Published in IEEE electron device letters (01.05.2007)
Get full text
Journal Article
Electronic structure of amorphous InGaO3(ZnO)0.5 thin films
Cho, Deok-Yong, Song, Jaewon, Hwang, Cheol Seong, Choi, Woo Seok, Noh, T.W., Kim, J.-Y., Lee, H.-G., Park, B.-G., Cho, S.-Y., Oh, S.-J., Jeong, Jong Han, Jeong, Jae Kyeong, Mo, Yeon-Gon
Published in Thin solid films (01.12.2009)
Published in Thin solid films (01.12.2009)
Get full text
Journal Article
Achieving High Field-Effect Mobility Exceeding 50 cm \(^}\) /Vs in In-Zn-Sn-O Thin-Film Transistors
Song, Ji Hun, Kim, Kwang Suk, Mo, Yeon Gon, Choi, Rino, Jeong, Jae Kyeong
Published in IEEE electron device letters (01.08.2014)
Published in IEEE electron device letters (01.08.2014)
Get full text
Journal Article
Positive Shift of Threshold Voltage in Short-Channel (L = 1.5 µm) p-Type Polycrystalline Silicon Thin-Film Transistor under Off-State Bias Stress
Choi, Sung-Hwan, Shin, Hee-Sun, Mo, Yeon-Gon, Kim, Hye-Dong, Han, Min-Koo
Published in Japanese Journal of Applied Physics (01.03.2009)
Published in Japanese Journal of Applied Physics (01.03.2009)
Get full text
Journal Article
Origin of Subthreshold Swing Improvement in Amorphous Indium Gallium Zinc Oxide Transistors
Jeong, Jong Han, Yang, Hui Won, Park, Jin-Seong, Jeong, Jae Kyeong, Mo, Yeon-Gon, Kim, Hye Dong, Song, Jaewon, Hwang, Cheol Seong
Published in Electrochemical and solid-state letters (2008)
Published in Electrochemical and solid-state letters (2008)
Get full text
Journal Article
Comprehensive studies of the degradation mechanism in amorphous InGaZnO transistors by the negative bias illumination stress
Ji, Kwang Hwan, Kim, Ji-In, Jung, Hong Yoon, Park, Se Yeob, Choi, Rino, Mo, Yeon Gon, Jeong, Jae Kyeong
Published in Microelectronic engineering (01.07.2011)
Published in Microelectronic engineering (01.07.2011)
Get full text
Journal Article
Conference Proceeding