Scaling Potential of Nanosheet Oxide Semiconductor FETs for Monolithic 3D Integration-ALD Material Engineering, High-Field Transport, Statistical Variability
Hikake, Kaito, Huang, Xingyu, Kim, Sung-Hun, Sakai, Kota, Li, Zhuo, Mizutani, Tomoko, Saraya, Takuya, Hiramoto, Toshiro, Takahashi, Takanori, Uenuma, Mutsunori, Uraoka, Yukiharu, Kobayashi, Masaharu
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
Published in 2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (16.06.2024)
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Conference Proceeding
Measurement of Static Random Access Memory Power-Up State Using an Addressable Cell Array Test Structure
Takeuchi, Kiyoshi, Mizutani, Tomoko, Shinohara, Hirofumi, Saraya, Takuya, Kobayashi, Masaharu, Hiramoto, Toshiro
Published in IEEE transactions on semiconductor manufacturing (01.08.2017)
Published in IEEE transactions on semiconductor manufacturing (01.08.2017)
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Journal Article
Measuring threshold voltage variability of 10G transistors
Mizutani, T., Kumar, A., Hiramoto, T.
Published in 2011 International Electron Devices Meeting (01.12.2011)
Published in 2011 International Electron Devices Meeting (01.12.2011)
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Conference Proceeding
Recovery and parmanent components of |Vth| shifts in pFETs by high-voltage on-state stress
Alias, Nurul Ezaila, Mizutani, Tomoko, Kumar, Anil, Saraya, Takuya, Hiramoto, Toshiro
Published in 2014 Silicon Nanoelectronics Workshop (SNW) (01.06.2014)
Published in 2014 Silicon Nanoelectronics Workshop (SNW) (01.06.2014)
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Conference Proceeding
Parallel nonvolatile programming of power-up states of SRAM cells
Hiramoto, Toshiro, Mizutani, Tomoko, Takeuchi, Kiyoshi, Kobayashi, Masaharu
Published in 2017 IEEE 12th International Conference on ASIC (ASICON) (01.10.2017)
Published in 2017 IEEE 12th International Conference on ASIC (ASICON) (01.10.2017)
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Conference Proceeding
Statistical analysis of minimum operation voltage (Vmin) in fully depleted silicon-on-thin-BOX (SOTB) SRAM cells
Mizutani, Tomoko, Yamamoto, Yoshiki, Makiyama, Hideki, Yamashita, Tomohiro, Oda, Hidekazu, Kamohara, Shiro, Sugii, Nobuyuki, Hiramoto, Toshiro
Published in 2014 Silicon Nanoelectronics Workshop (SNW) (01.06.2014)
Published in 2014 Silicon Nanoelectronics Workshop (SNW) (01.06.2014)
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Conference Proceeding
Statistical analysis of four write stability metrics in fully depleted silicon-on-thin-BOX (SOTB) and bulk SRAM cells at low supply voltage
Hao Qiu, Mizutani, Tomoko, Yamamoto, Yoshiki, Makiyama, Hideki, Yamashita, Tomohiro, Oda, Hidekazu, Kamohara, Shiro, Sugii, Nobuyuki, Saraya, Takuya, Kobayashi, Masaharu, Hiramoto, Toshiro
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
Published in 2014 12th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (01.10.2014)
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Conference Proceeding
Statistical analyses of random telegraph noise amplitude in ultra-narrow (deep sub-10nm) silicon nanowire transistors
Hao Qiu, Takeuchi, Kiyoshi, Mizutani, Tomoko, Saraya, Takuya, Jiezhi Chen, Kobayashi, Masaharu, Hiramoto, Toshiro
Published in 2017 Symposium on VLSI Technology (01.06.2017)
Published in 2017 Symposium on VLSI Technology (01.06.2017)
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Conference Proceeding
Ultra-low voltage (0.1V) operation of Vth self-adjusting MOSFET and SRAM cell
Ueda, Akitsugu, Seung-Min Jung, Mizutani, Tomoko, Kumar, Anil, Saraya, Takuya, Hiramoto, Toshiro
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
Published in 2014 Symposium on VLSI Technology (VLSI-Technology): Digest of Technical Papers (01.06.2014)
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Conference Proceeding
(Invited) Ultralow-Voltage Design and Technology of Silicon-on Thin-Buried-Oxide (SOTB) CMOS for High Energy Efficient Electronics in IoT Era
Yamamoto, Yoshiki, Makiyama, Hideki, Yamashita, Tomohiro, Oda, Hidekazu, Kamohara, Shiro, Sugii, Nobuyuki, Yamaguchi, Yasuo, Mizutani, Tomoko, Kobayashi, Masaharu, Hiramoto, Toshiro
Published in ECS transactions (27.03.2015)
Published in ECS transactions (27.03.2015)
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Journal Article
Statistical analysis of characteristics variability in bulk MOSFETs at Cryogenic Temperature
Mizutani, Tomoko, Takeuchi, Kiyoshi, Saraya, Takuya, Kobayashi, Masaharu, Hiramoto, Toshiro
Published in 2021 Silicon Nanoelectronics Workshop (SNW) (13.06.2021)
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Published in 2021 Silicon Nanoelectronics Workshop (SNW) (13.06.2021)
Conference Proceeding
A Charge-Based Analytical Threshold Voltage Definition Applicable to Cryogenic Temperatures
Takeuchi, Kiyoshi, Mizutani, Tomoko, Saraya, Takuya, Kobayashi, Masaharu, Hiramoto, Toshiro
Published in 2021 Silicon Nanoelectronics Workshop (SNW) (13.06.2021)
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Published in 2021 Silicon Nanoelectronics Workshop (SNW) (13.06.2021)
Conference Proceeding