Study of 90-nm MOSFET subthreshold hump characteristics using newly developed MOSFET array test structure
Mizumura, A., Oishi, T., Yokoyama, N., Nonaka, M., Tanaka, S., Ammo, H.
Published in IEEE transactions on semiconductor manufacturing (01.02.2006)
Published in IEEE transactions on semiconductor manufacturing (01.02.2006)
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Conference Proceeding
A study of variation in characteristics and subthreshold humps for 65-nm SRAM using newly developed SRAM cell array test structure
Mizumura, A., Suzuki, T., Arima, T., Maeda, H., Ammo, H.
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
Published in 2008 IEEE International Conference on Microelectronic Test Structures (01.03.2008)
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Conference Proceeding
m-chloroperbenzoic acid oxidation of 1,2-dithietes: First synthesis and characterization of 1,2-dithiete s-oxides and ethane-1,2-dithione S,S′-Dioxides (α-Disulfines)
Nakayama, Juzo, Mizumura, Ayako, Yokomori, Yoshinobu, Krebs, Adolf, Schütz, Karin
Published in Tetrahedron letters (20.11.1995)
Published in Tetrahedron letters (20.11.1995)
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Journal Article
A study of 90nm MOSFET subthreshold hump characteristics using newly developed MOSFET array test structure
Mizumura, A., Ohishi, T., Yokoyama, N., Nonaka, M., Tanaka, S., Ammo, H.
Published in Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005 (2005)
Published in Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005 (2005)
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Conference Proceeding
Sub- µm polysilicon super thin film transistor
Ohshima, T., Negishi, M., Hayashi, H., Noguchi, T., Mizumura, A.
Published in 1986 International Electron Devices Meeting (1986)
Published in 1986 International Electron Devices Meeting (1986)
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