Characterization of high-k/metal gate stack breakdown in the time scale of ESD events
Yang Yang, Di Sarro, J, Gauthier, R J, Chatty, K, Junjun Li, Mishra, R, Mitra, S, Ioannou, D E
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
Published in 2010 IEEE International Reliability Physics Symposium (01.01.2010)
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Conference Proceeding
OPERATING VOLTAGE-TRIGGERED SEMICONDUCTOR CONTROLLED RECTIFIER
GAUTHIER ROBERT J. JR, MIAO MENG, MITRA SOUVICK, LOISEAU ALAIN F, NATH ANINDYA, LIANG WEI
Year of Publication 02.01.2024
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Year of Publication 02.01.2024
Patent
ESD Protection Analysis for 3D NAND Internal Source Plate Discharge Circuit
Davis, James, Mitra, Souvick, Marr, Ken, O'Sullivan, Greg, Cerafogli, Chiara, Rabbani, Tania
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
Published in 2024 46th Annual EOS/ESD Symposium (EOS/ESD) (16.09.2024)
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Conference Proceeding
Effect of Floating-Body and Stress Bias on NBTI and HCI on 65-nm SOI pMOSFETs
Mishra, R., Ioannou, D.E., Mitra, S., Gauthier, R.
Published in IEEE electron device letters (01.03.2008)
Published in IEEE electron device letters (01.03.2008)
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Journal Article
High-Voltage Electrostatic Discharge Protection Device development in 28nm BCDLite Technology
Mahajan, Prantik, Ganesan, Vishal, Subramani, Nandha Kumar, Jain, Ruchil, Mitra, Souvick, Gauthier, Robert
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
Published in 2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) (18.07.2022)
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Conference Proceeding