TESTING METHOD FOR A SEMICONDUCTOR MEMORY DEVICE
YANAGISAWA, KAZUMASA, KATSUKAWA, KORO, OUJI, YOSHIAKI, NAKAMURA, MASAYUKI, NOZOE, ATSUSHI, MATSUMOTO, TETSURO, KOBAYASHI, YUTAKA, ISHII, KYOKO, MISASHI, WAZUO, KINOSHITA, YOSHITAKA, WADA, SHOJI, OTA, TATSUYUKI, UDAKAWA, TETSU, MIWA, HITOSHI, TSUKADA, HIROMI
Year of Publication 17.08.1998
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Year of Publication 17.08.1998
Patent