Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation
Sharma, Prateek, Tyaginov, Stanislav, Wimmer, Yannick, Rudolf, Florian, Rupp, Karl, Bina, Markus, Enichlmair, Hubert, Jong-Mun Park, Minixhofer, Rainer, Ceric, Hajdin, Grasser, Tibor
Published in IEEE transactions on electron devices (01.06.2015)
Published in IEEE transactions on electron devices (01.06.2015)
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Journal Article
Evaluation of the impact of defects on threshold voltage drift employing SiO2 pMOS transistors
Tselios, Konstantinos, Michl, Jakob, Knobloch, Theresia, Enichlmair, Hubert, Ioannidis, Eleftherios G., Minixhofer, Rainer, Grasser, Tibor, Waltl, Michael
Published in Microelectronics and reliability (01.11.2022)
Published in Microelectronics and reliability (01.11.2022)
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Journal Article
Impact of single-defects on the variability of CMOS inverter circuits
Waltl, Michael, Waldhoer, Dominic, Tselios, Konstantinos, Stampfer, Bernhard, Schleich, Christian, Rzepa, Gerhard, Enichlmair, Hubert, Ioannidis, Eleftherios G., Minixhofer, Rainer, Grasser, Tibor
Published in Microelectronics and reliability (01.11.2021)
Published in Microelectronics and reliability (01.11.2021)
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Journal Article
A DLTS study on Deep Trench Processing induced Trap States in Silicon Photodiodes
Stampfer, Paul, Stampfer, Bernhard, Roger, Frederic, Minixhofer, Rainer, Grasser, Tibor, Waltl, Michael
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)
Published in 2023 IEEE International Integrated Reliability Workshop (IIRW) (08.10.2023)
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Conference Proceeding
An EBIC Model for TCAD Simulation to Determine the Surface Recombination Rate in Semiconductor Devices
Kraxner, Andrea, Roger, Frederic, Loeffler, Bernhard, Faccinelli, Martin, Fisslthaler, Evelin, Minixhofer, Rainer, Hadley, Peter
Published in IEEE transactions on electron devices (01.11.2016)
Published in IEEE transactions on electron devices (01.11.2016)
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Journal Article
적외선 장치
ALI SYED ZEESHAN, MINIXHOFER RAINER, HOPPER RICHARD HENRY, UDREA FLORIN
Year of Publication 21.08.2020
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Year of Publication 21.08.2020
Patent
Towards probabilistic analog behavioral modeling
Lange, Andre, Harasymiv, Ihor, Eisenberger, Oliver, Roger, Frederic, Haase, Joachim, Minixhofer, Rainer
Published in 2015 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2015)
Published in 2015 IEEE International Symposium on Circuits and Systems (ISCAS) (01.05.2015)
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Conference Proceeding
TCAD as an integral part of the semiconductor manufacturing environment
Minixhofer, R.
Published in 2006 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2006)
Published in 2006 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2006)
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Conference Proceeding
Modeling Next Generation Sensor Chips: Towards Predictive Band Structure Models for Quarternary III- V Semiconductor Alloys
Gentles, Angus, Dehghani, Mohammad, Minixhofer, Rainer, Khakbaz, Pedram, Waldhor, Dominic, Waltl, Michael
Published in 2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (24.09.2024)
Published in 2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (24.09.2024)
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Conference Proceeding
Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures
Entner, Robert, Grasser, Tibor, Triebl, Oliver, Enichlmair, Hubert, Minixhofer, Rainer
Published in Microelectronics and reliability (01.04.2007)
Published in Microelectronics and reliability (01.04.2007)
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Journal Article
Conference Proceeding
TCAD study of Single Photon Avalanche Diode on 0.35μm high voltage technology
Roger, Frederic, Teva, Jordi, Wachmann, Ewald, Jong Mun Park, Minixhofer, Rainer
Published in 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2013)
Published in 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2013)
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Conference Proceeding
Evaluation of the Robustness of the Defect-Centric Model for Defect Parameter Extraction from RTN Analysis
Loesener, Martin E. M., Zinsler, Tobias, Stampfer, Bernhard, Wimmer, Florian, Ioannidis, Eleftherios, Monga, Udit, Pflanzl, Walter, Minixhofer, Rainer, Grasser, Tibor, Waltl, Michael
Published in 2024 Austrochip Workshop on Microelectronics (Austrochip) (25.09.2024)
Published in 2024 Austrochip Workshop on Microelectronics (Austrochip) (25.09.2024)
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Conference Proceeding
Hot-carrier behaviour and ron-BV trade-off optimization for p-channel LDMOS transistors in a 180 nm HV-CMOS technology
Jong Mun Park, Knaipp, M., Enichlmair, H., Minixhofer, R., Yun Shi, Feilchenfeld, N.
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)
Published in 2012 24th International Symposium on Power Semiconductor Devices and ICs (01.06.2012)
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Conference Proceeding