Search Results - "MINEKAWA, Yohei" :: K.UTB vyhledávací portál

Prediction of sweetness and amino acid content in soybean crops from hyperspectral imagery

by Monteiro, Sildomar Takahashi, Minekawa, Yohei, Kosugi, Yukio, Akazawa, Tsuneya, Oda, Kunio
Published in ISPRS journal of photogrammetry and remote sensing (01.05.2007)

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Defect detection techniques robust to process variation in semiconductor inspection

by Harada, Minoru, Minekawa, Yohei, Nakamae, Koji
Published in Measurement science & technology (01.03.2019)

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INSPECTION SYSTEM AND NON-TEMPORARY COMPUTER READABLE MEDIUM

by MINEKAWA YOHEI, HIRAI TOMOHIRO, TAKADA SATORU
Year of Publication 30.01.2024

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Patent

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시료 관찰 시스템 및 화상 처리 방법

by KONDO NAOAKI, MINEKAWA YOHEI, HARADA MINORU
Year of Publication 08.09.2022

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Patent

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결함 검사 시스템 및 결함 검사 방법

by KONDO NAOAKI, MINEKAWA YOHEI, HARADA MINORU
Year of Publication 15.07.2022

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Patent

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결함 분류 장치, 결함 분류 프로그램

by MINEKAWA YOHEI, TAKADA SATOSHI, HIRAI TAKEHIRO
Year of Publication 17.05.2022

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Patent

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검사 시스템, 및 비일시적 컴퓨터 판독 가능 매체

by MINEKAWA YOHEI, TAKADA SATOSHI, HIRAI TAKEHIRO
Year of Publication 17.05.2022

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Patent

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MACHINE LEARNING SYSTEM AND MACHINE LEARNING METHOD

by MINEKAWA YOHEI, ABE YUICHI, ISHIKAWA MASAYOSHI, ASAI DAISUKE, IKEDA KOJI
Year of Publication 28.07.2023

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Patent

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SAMPLE OBSERVATION SYSTEM AND IMAGE PROCESSING METHOD

by KONDO NAOAKI, MINEKAWA YOHEI, HARADA MINORU
Year of Publication 16.09.2021

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Patent

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SAMPLE OBSERVATION SYSTEM AND IMAGE PROCESSING METHOD

by KONDO, Naoaki, HARADA, Minoru, MINEKAWA, Yohei
Year of Publication 10.09.2021

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Patent

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METHOD AND DEVICE FOR TRAINING MACHINE LEARNING MODEL

by MINEKAWA Yohei, ABE Yuichi, KATAGISHI Makoto, IKEDA Mitsuji
Year of Publication 30.03.2023

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Patent

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DEFECT INSPECTING SYSTEM AND DEFECT INSPECTING METHOD

by HARADA, Minoru, KONDO, Naoaki, MINEKAWA, Yohei
Year of Publication 01.07.2021

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Patent

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DEFECT CLASSIFICATION DEVICE AND DEFECT CLASSIFICATION PROGRAM

by MINEKAWA YOHEI, HIRAI TOMOHIRO, TAKADA SATORU
Year of Publication 30.04.2021

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Patent

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INSPECTION SYSTEM AND NON-TRANSITORY COMPUTER-READABLE MEDIUM

by HIRAI Takehiro, MINEKAWA Yohei, TAKADA Satoshi
Year of Publication 22.04.2021

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Patent

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DEFECT-CLASSIFYING DEVICE AND DEFECT-CLASSIFYING PROGRAM

by HIRAI Takehiro, MINEKAWA Yohei, TAKADA Satoshi
Year of Publication 22.04.2021

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Patent

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MACHINE LEARNING SYSTEM

by ISHIKAWA Masayoshi, ASAI Daisuke, MINEKAWA Yohei, SASAKI Goshi, ABE Yuichi, IKEDA Mitsuji
Year of Publication 27.06.2024

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Patent

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CHARGED PARTICLE BEAM DEVICE

by MINEKAWA YOHEI, FUKUDA MUNEYUKI, CHIBA KOHEI, KISHIMOTO TAKANORI
Year of Publication 27.12.2021

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Patent

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CHARGED PARTICLE BEAM APPARATUS

by MINEKAWA YOHEI, FUKUDA MUNEYUKI, CHIBA KOHEI, KISHIMOTO TAKANORI
Year of Publication 21.12.2021

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Patent

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SAMPLE OBSERVATION DEVICE AND METHOD

by KONDO NAOAKI, MINEKAWA YOHEI, HARADA MINORU, DOI YUKI, NAKAYAMA HIDEKI, TAKAGI YUJI
Year of Publication 10.01.2023

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Patent

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SAMPLE OBSERVATION DEVICE AND SAMPLE OBSERVATION METHOD

by KONDO NAOAKI, MINEKAWA YOHEI, HARADA MINORU, DOI YUKI, NAKAYAMA HIDEKI, TAKAGI YUJI
Year of Publication 29.12.2022

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Patent

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