Investigation of the in-plane and out-of-plane electrical properties of metallic nanoparticles in dielectric matrix thin films elaborated by atomic layer deposition
Thomas, D, Puyoo, E, Le Berre, M, Militaru, L, Koneti, S, Malchère, A, Epicier, T, Roiban, L, Albertini, D, Sabac, A, Calmon, F
Published in Nanotechnology (10.11.2017)
Published in Nanotechnology (10.11.2017)
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Journal Article
Investigation of the in-plane and out-of-plane electrical properties of metallic nanoparticles in dielectric matrix thin films elaborated by atomic layer deposition
Thomas, D, Puyoo, E, Le Berre, M, Militaru, L, Koneti, S, Malchère, A, Epicier, T, Roiban, L, Albertini, D, Sabac, A, Calmon, F
Published in Nanotechnology (16.10.2017)
Published in Nanotechnology (16.10.2017)
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Journal Article
Multilayer Structure in SeAsGeSi-based OTS for High Thermal Stability and Reliability Enhancement
Laguna, C., Bernard, M., Garrione, J., Castellani, N., Meli, V., Martin, S., Aussenac, F., Rouchon, D., Rochat, N., Nolot, E., Bourgeois, G., Cyrille, M. C., Militaru, L., Souifi, A., Andrieu, F., Navarro, G.
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
Published in ESSDERC 2022 - IEEE 52nd European Solid-State Device Research Conference (ESSDERC) (19.09.2022)
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Conference Proceeding
Traps centers impact on Silicon nanocrystal memories given by Random Telegraph Signal and low frequency noise
Trabelsi, M., Militaru, L., Sghaier, N., Souifi, A., Yacoubi, N.
Published in Solid-state electronics (01.02.2011)
Published in Solid-state electronics (01.02.2011)
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Journal Article
Interpretation of scanning capacitance microscopy for thin oxides characterization
Ligor, O., Gautier, B., Descamps-Mandine, A., Albertini, D., Baboux, N., Militaru, L.
Published in Thin solid films (30.10.2009)
Published in Thin solid films (30.10.2009)
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Journal Article
Influence of the surrounding ambient on the reliability of the electrical characterization of thin oxide layers using an atomic force microscope
Hourani, W., Gautier, B., Militaru, L., Albertini, D., Descamps-Mandine, A., Arinero, R.
Published in Microelectronics and reliability (01.12.2011)
Published in Microelectronics and reliability (01.12.2011)
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Journal Article
Ion beam synthesis of indium-oxide nanocrystals for improvement of oxide resistive random-access memories
Bonafos, C, Benassayag, G, Cours, R, Pécassou, B, Guenery, P V, Baboux, N, Militaru, L, Souifi, A, Cossec, E, Hamga, K, Ecoffey, S, Drouin, D
Published in Materials research express (01.01.2018)
Published in Materials research express (01.01.2018)
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Journal Article
Perturbative phenomena affecting the quality of local measurements of electrical quantities at nanoscale
Gautier, B., Iazykov, M., Grandfond, A., Martin, S., Baboux, N., Militaru, L., Albertini, D.
Published in 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) (01.08.2014)
Published in 29th Conference on Precision Electromagnetic Measurements (CPEM 2014) (01.08.2014)
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Conference Proceeding
Journal Article
Parameters extraction of hafnium based gate oxide capacitors
Nguyen, T., Busseret, C., Militaru, L., Poncet, A., Aimé, D., Baboux, N., Plossu, C.
Published in Microelectronics and reliability (01.04.2007)
Published in Microelectronics and reliability (01.04.2007)
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Journal Article
Conference Proceeding
Multilayer OTS Selectors Engineering for High Temperature Stability, Scalability and High Endurance
Laguna, C., Bernard, M., Bernier, N., Rouchon, D., Rochat, N., Garrione, J., Jannaud, A., Nolot, E., Meli, V., Castellani, N., Sabbione, C., Bourgeois, G., Cyrille, M. C., Militaru, L., Souifi, A., Navarro, G., Nowak, E.
Published in 2021 IEEE International Memory Workshop (IMW) (01.05.2021)
Published in 2021 IEEE International Memory Workshop (IMW) (01.05.2021)
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Conference Proceeding
Innovative Multilayer OTS Selectors for Performance Tuning and Improved Reliability
Laguna, C., Castellani, N., Bernard, M., Rochat, N., Rouchon, D., Sabbione, C., Garrione, J., Nolot, E., Bourgeois, G., Cyrille, M. C., Militaru, L., Souifi, A., Navarro, G., Nowak, E.
Published in 2020 IEEE International Memory Workshop (IMW) (01.05.2020)
Published in 2020 IEEE International Memory Workshop (IMW) (01.05.2020)
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Conference Proceeding
Electrical characterization of SrTiO3 thin films deposited on Si(001) substrate by liquid injection MOCVD
LEGRAND, J, LHOSTIS, S, DUCROQUET, F, CHANG, Y, MILITARU, L, LAMARD, C, SIBAI, A, AUVRAY, L, AUDIER, M, SENATEUR, J.-P, DUBOURDIEU, C
Published in Microelectronic engineering (01.04.2004)
Published in Microelectronic engineering (01.04.2004)
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Conference Proceeding
Journal Article
RTS noise in submicron SiGe epitaxial base bipolar transistors
Militaru, L., Souifi, A., Mouis, M., Brémond, G.
Published in Microelectronics and reliability (01.08.2000)
Published in Microelectronics and reliability (01.08.2000)
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Journal Article
Coulomb-blockade in nanometric Si-film silicon-on-nothing (SON) MOSFETs
Monfray, S., Souifi, A., Boeuf, F., Ortolland, C., Poncet, A., Militaru, L., Chanemougame, D., Skotnicki, T.
Published in IEEE transactions on nanotechnology (01.12.2003)
Published in IEEE transactions on nanotechnology (01.12.2003)
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Conference Proceeding