Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry--application to absolute long gauge block measurement
Decker, Jennifer E, Miles, John R, Madej, Alan A, Siemsen, Ralph F, Siemsen, Klaus J, de Bonth, Sebastian, Bustraan, Krijn, Temple, Sara, Pekelsky, James R
Published in Applied optics (2004) (01.10.2003)
Published in Applied optics (2004) (01.10.2003)
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