Will They Stay or Will They Go — Understanding South Atlantic Coastal Wetland Transformation in Response to Sea-Level Rise
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Published in Estuaries and coasts (01.11.2024)
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Defect reduction for 20nm high-k metal gate technology
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Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)
Published in 2015 26th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2015)
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Conference Proceeding
SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
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Year of Publication 23.10.2024
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Year of Publication 23.10.2024
Patent
IMAGING REFLECTOMETRY FOR INLINE SCREENING
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Year of Publication 06.12.2023
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Year of Publication 06.12.2023
Patent
SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
LENOX, Chet, VON DEN HOFF, Mike, PRICE, David, W, DONZELLA, Oreste, ROBINSON, John, GROOS, Thomas, NARASIMHAN, Narayani, LIM, Teng, Song, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry, RATHERT, Robert, J
Year of Publication 27.09.2023
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Year of Publication 27.09.2023
Patent
IMAGING REFLECTOMETRY FOR INLINE SCREENING
Groos, Thomas, Rathert, Robert J, Donzella, Oreste, Lach, Justin, Price, David W, Robinson, John Charles, Lenox, Chet V, Pandev, Stilian, Von Den Hoff, Mike, Saville, Barry, Li, Shifang
Year of Publication 29.09.2022
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Year of Publication 29.09.2022
Patent
SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
LENOX, Chet, VON DEN HOFF, Mike, LIM, Teng, DONZELLA, Oreste, ROBINSON, John, RATHERT, Robert, GROOS, Thomas, NARASIMHAN, Narayani, PRICE, David, LACH, Justin, SHERMAN, Kara, SAVILLE, Barry
Year of Publication 23.06.2022
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Year of Publication 23.06.2022
Patent
IMAGING REFLECTOMETRY FOR INLINE SCREENING
VON DEN HOFF, Mike, PRICE, David W, DONZELLA, Oreste, GROOS, Thomas, ROBINSON, John Charles, LENOX, Chet V, LACH, Justin, PANDEV, Stilian, SAVILLE, Barry, LI, Shifang, RATHERT, Robert J
Year of Publication 29.09.2022
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Year of Publication 29.09.2022
Patent
SYSTEM AND METHOD FOR AUTOMATICALLY IDENTIFYING DEFECT-BASED TEST COVERAGE GAPS IN SEMICONDUCTOR DEVICES
Robinson, John, Groos, Thomas, Lim, Teng Song, Rathert, Robert J, Donzella, Oreste, Lach, Justin, Price, David W, Sherman, Kara L, Lenox, Chet V, Narasimhan, Narayani, Von Den Hoff, Mike, Saville, Barry
Year of Publication 23.06.2022
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Year of Publication 23.06.2022
Patent
Advanced in-line part average testing
Cappel, Robert, Groos, Thomas, Rathert, Robert J, Donzella, Oreste, Lim, Teng-Song, Price, David W, Hoff, Mike Von Den, Bhatti, Naema, Sutherland, Doug, Sherman, Kara L, Robinson, John Charles, Saville, Barry
Year of Publication 05.04.2022
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Year of Publication 05.04.2022
Patent
IDENTIFYING NUISANCES AND DEFECTS OF INTEREST IN DEFECTS DETECTED ON A WAFER
VON DEN HOFF, Mike, PLIHAL, Martin, SAH, Kaushik, CROSS, Andrew, MANI, Antonio, DUFFY, Brian
Year of Publication 07.03.2019
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Year of Publication 07.03.2019
Patent
ADVANCED IN-LINE PART AVERAGE TESTING
VON DEN HOFF, Mike, PRICE, David W, LIM, Alex, DONZELLA, Oreste, SUTHERLAND, Doug, GROOS, Thomas, ROBINSON, John C, CAPPEL, Robert, SAVILLE, Barry, SHERMAN, Kara L, RATHERT, Robert J, BHATTI, Naema
Year of Publication 15.07.2021
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Year of Publication 15.07.2021
Patent
ADVANCED IN-LINE PART AVERAGE TESTING
Cappel, Robert, Groos, Thomas, Rathert, Robert J, Donzella, Oreste, Lim, Teng-Song, Price, David W, Hoff, Mike Von Den, Bhatti, Naema, Sutherland, Doug, Sherman, Kara L, Robinson, John Charles, Saville, Barry
Year of Publication 15.07.2021
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Year of Publication 15.07.2021
Patent
Identifying nuisances and defects of interest in defects detected on a wafer
DUFFY, BRIAN, SAH, KAUSHIK, VON DEN HOFF, MIKE, MANI, ANTONIO, CROSS, ANDREW JAMES, PLIHAL, MARTIN
Year of Publication 01.01.2022
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Year of Publication 01.01.2022
Patent
System and method for automatically identifying defect-based test coverage gaps in semiconductor devices
RATHER ROBERT J, GRUSS TOBIAS, VON DEN HOFF MIKE, SAVILLE BRIAN, SHERMAN KAMRAN, DONZELLA OSVALDO, LIN XUANZHENG, LACH JOHANNES, NARASIMHAN NARASIMHAN, ROBINSON JOHN, PRICE DAVID W, LENOX CHRISTIAN
Year of Publication 11.08.2023
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Year of Publication 11.08.2023
Patent
Advanced in-line part average testing
SAVILLE, BARRY, RATHERT, ROBERT J, BHATTI, NAEMA, VON DEN HOFF, MIKE, CAPPEL, ROBERT, SHERMAN, KARA L, PRICE, DAVID W, DONZELLA, ORESTE, SUTHERLAND, DOUG, GROOS, THOMAS, LIM, TENG-SONG, ROBINSON, JOHN CHARLES
Year of Publication 21.03.2024
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Year of Publication 21.03.2024
Patent