Super-Resolution Imaging of Sub-diffraction-Limited Pattern with Superlens Based on Deep Learning
Guan, Yizhao, Masui, Shuzo, Kadoya, Shotaro, Michihata, Masaki, Takahashi, Satoru
Published in International journal of precision engineering and manufacturing (01.09.2024)
Published in International journal of precision engineering and manufacturing (01.09.2024)
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Journal Article
Correction: Super-Resolution Imaging of Sub-diffraction-Limited Pattern with Superlens Based on Deep Learning
Guan, Yizhao, Masui, Shuzo, Kadoya, Shotaro, Michihata, Masaki, Takahashi, Satoru
Published in International journal of precision engineering and manufacturing (2024)
Published in International journal of precision engineering and manufacturing (2024)
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Journal Article
Radial mode number identification on whispering gallery mode resonances for diameter measurement of microsphere
Kobayashi, Yumeki, Michihata, Masaki, Zhao, Zheng, Chu, Bohuai, Takamasu, Kiyoshi, Takahashi, Satoru
Published in Measurement science & technology (10.05.2019)
Published in Measurement science & technology (10.05.2019)
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Journal Article
The FDTD analysis for dark field in-process depth measurements of fine microgrooves
Guan, Yizhao, Kadoya, Shotaro, Michihata, Masaki, Takahashi, Satoru
Published in Measurement. Sensors (01.12.2021)
Published in Measurement. Sensors (01.12.2021)
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Journal Article
In-process Measurement of Gradient Boundary of Resin in Evanescent-wave-based Nano-stereolithography using Reflection Interference Near Critical Angle
Kong, Deqing, Michihata, Masaki, Takamasu, Kiyoshi, Takahashi, Satoshi
Published in Journal of Photopolymer Science and Technology (25.06.2018)
Published in Journal of Photopolymer Science and Technology (25.06.2018)
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Journal Article