Search Results - "MICHAEL E ADEL" :: K.UTB vyhledávací portál | TBU Library Retrieval Portal

METROLOGY TARGETS, METROLOGY MODULES AND METROLOGY METHODS

METROLOGY TARGETS, METROLOGY MODULES AND METROLOGY METHODS

by MARK DAVIS SMITH, DANIEL KANDEL, LEE MYUNGJUN, MICHAEL E ADEL, AMIT ERAN
Year of Publication 01.07.2021

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Patent

SUBSTRATE MATRIX TO DECOUPLE TOOL AND PROCESS EFFECTS

SUBSTRATE MATRIX TO DECOUPLE TOOL AND PROCESS EFFECTS

by DANIEL KANDEL, PAVEL IZIKSON, MICHAEL E ADEL
Year of Publication 09.11.2017

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Patent

Unravelling technology meta-landscapes: A patent analytics approach to assess trajectories and fragmentation

Unravelling technology meta-landscapes: A patent analytics approach to assess trajectories and fragmentation

by Adel, Michael E., Harrison, Christopher
Published in World patent information (01.03.2024)

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Journal Article

Zipf's law applications in patent landscape analysis

Zipf's law applications in patent landscape analysis

by Adel, Michael E.
Published in World patent information (01.03.2021)

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Journal Article

METROLOGY TARGET DESIGN METHOD, APPARATUS, AND MEDIUM

METROLOGY TARGET DESIGN METHOD, APPARATUS, AND MEDIUM

by DANIEL KANDEL, MICHAEL E ADEL, AMNON MANASSEN
Year of Publication 28.04.2016

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Patent

SUBSTRATE MATRIX TO DECOUPLE TOOL AND PROCESS EFFECTS

SUBSTRATE MATRIX TO DECOUPLE TOOL AND PROCESS EFFECTS

by DANIEL KANDEL, PAVEL IZIKSON, MICHAEL E ADEL
Year of Publication 15.10.2015

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Patent

OPTIMIZATION OF LIGHT DISPERSION MEASURING TARGET DESIGNING

OPTIMIZATION OF LIGHT DISPERSION MEASURING TARGET DESIGNING

by DANIEL KANDEL, MICHAEL E ADEL, AMNON MANASSEN
Year of Publication 26.02.2015

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Patent

METHOD AND DEVICE FOR DESIGN AND USE OF MICRO TARGET IN OVERLAY MEASUREMENT

METHOD AND DEVICE FOR DESIGN AND USE OF MICRO TARGET IN OVERLAY MEASUREMENT

by VLADIMIR LEVINSKI, DANIEL KANDEL, AVIV FROMMER, MICHAEL E ADEL
Year of Publication 26.02.2015

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Patent

METHOD OF DISPOSITIONING AND CONTROL OF A SEMICONDUCTOR MANUFACTURING PROCESS

METHOD OF DISPOSITIONING AND CONTROL OF A SEMICONDUCTOR MANUFACTURING PROCESS

by MACK, Chris, ADEL, Michael E
Year of Publication 29.08.2024

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Patent

Method of Dispositioning and Control of a Semiconductor Manufacturing Process

Method of Dispositioning and Control of a Semiconductor Manufacturing Process

by Mack, Chris, Adel, Michael E
Year of Publication 01.08.2024

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Patent

METHOD AND SYSTEM OF DATABASE ANALYSIS AND COMPRESSION

METHOD AND SYSTEM OF DATABASE ANALYSIS AND COMPRESSION

by Adel, Michael E
Year of Publication 16.06.2022

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Patent

SOLAR THERMAL COLLECTOR COMPRISING A RADIATION BASED OVERHEAT PREVENTION MECHANISM

SOLAR THERMAL COLLECTOR COMPRISING A RADIATION BASED OVERHEAT PREVENTION MECHANISM

by ADEL, Michael E
Year of Publication 26.08.2020

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Patent

Verification metrology targets and their design

Verification metrology targets and their design

by Tarshish-Shapir, Inna, Wei, Shiming, Ghinovker, Mark, Adel, Michael E
Year of Publication 16.01.2024

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Patent

Metrology target design for tilted device designs

Metrology target design for tilted device designs

by Amit, Eran, Kandel, Daniel, Smith, Mark D, Adel, Michael E, Lee, Myungjun
Year of Publication 15.10.2024

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Patent

RADIATION BASED OVERHEAT PREVENTION MECHANISM FOR SOLAR THERMAL COLLECTORS

RADIATION BASED OVERHEAT PREVENTION MECHANISM FOR SOLAR THERMAL COLLECTORS

by ADEL, MICHAEL E
Year of Publication 21.10.2015

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Patent

Verification Metrology Targets and Their Design

Verification Metrology Targets and Their Design

by Tarshish-Shapir, Inna, Wei, Shiming, Ghinovker, Mark, Adel, Michael E
Year of Publication 05.11.2020

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Patent

PROCESS COMPATIBILITY IMPROVEMENT BY FILL FACTOR MODULATION

PROCESS COMPATIBILITY IMPROVEMENT BY FILL FACTOR MODULATION

by AHARON, Sharon, HAJAJ, Eitan, LEVINSKI, Vladimir, NEGRI, Daria, LEE, Myungjun, ADEL, Michael E, PASKOVER, Yuri, MANASSEN, Amnon, SMITH, Mark D, ITZKOVICH, Tal, LUBASHEVSKY, Yuval
Year of Publication 06.03.2024

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Patent

SCATTEROMETRY METROLOGY TARGET DESIGN OPTIMIZATION

SCATTEROMETRY METROLOGY TARGET DESIGN OPTIMIZATION

by ADEL, Michael E, MANASSEN, Amnon, KANDEL, Daniel
Year of Publication 31.10.2018

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Patent

RADIATION BASED OVERHEAT PREVENTION MECHANISM FOR SOLAR THERMAL COLLECTORS

RADIATION BASED OVERHEAT PREVENTION MECHANISM FOR SOLAR THERMAL COLLECTORS

by ADEL, MICHAEL E
Year of Publication 19.11.2014

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Patent

SCATTEROMETRY METROLOGY TARGET DESIGN OPTIMIZATION

SCATTEROMETRY METROLOGY TARGET DESIGN OPTIMIZATION

by ADEL, Michael E, MANASSEN, Amnon, KANDEL, Daniel
Year of Publication 25.10.2017

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Patent

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