Analysis of lateral DMOS power devices under ESD stress conditions
Mergens, M.P.J., Wilkening, W., Mettler, S., Wolf, H., Stricker, A., Fichtner, W.
Published in IEEE transactions on electron devices (01.11.2000)
Published in IEEE transactions on electron devices (01.11.2000)
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Journal Article
Modular approach of a high current MOS compact model for circuit-level ESD simulation including transient gate-coupling behaviour
Mergens, Markus, Wilkening, Wolfgang, Mettler, Stephan, Wolf, Heinrich, Fichtner, Wolfgang
Published in Microelectronics and reliability (2000)
Published in Microelectronics and reliability (2000)
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Journal Article
Characterization and optimization of a bipolar ESD-device by measurements and simulations
Stricker, Andreas D., Mettler, Stephan, Wolf, Heinrich, Mergens, Markus, Wilkening, Wolfgang, Gieser, Horst, Fichtner, Wolfgang
Published in Microelectronics and reliability (01.11.1999)
Published in Microelectronics and reliability (01.11.1999)
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Journal Article
Leistungstransistor und Verfahren zur Herstellung eines Leistungstransistors
Nguegang Ngnetiwe, Eric, Mettler, Stephan, Costachescu, Dragos, Davies, Neil, Lipski, Frank
Year of Publication 06.06.2019
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Year of Publication 06.06.2019
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