Fault Modeling of ECL for High Fault Coverage of Physical Defects
Menon, Sankaran M., Malaiya, Yashwant K., Jayasumana, Anura P.
Published in VLSI Design (01.01.1996)
Published in VLSI Design (01.01.1996)
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Journal Article
Operational and Test Performance in the Presence of Built-in Current Sensors
Menon, Sankaran M, Malaiya, Yashwant K, Jayasumana, Anura P, Tong, Carol Q
Published in VLSI Design (01.01.1997)
Published in VLSI Design (01.01.1997)
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Journal Article
Apparatus and method to debug a voltage regulator
Menon, Sankaran M, Balasingam, Naveendran, Koh, Sunghyun, Bibikar, Vasudev, Sahajananda, P. Reddy
Year of Publication 27.06.2023
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Year of Publication 27.06.2023
Patent
ECL storage elements: modeling of faulty behavior
Menon, S.M., Malaiya, Y.K., Jayasumana, A.P.
Published in IEEE transactions on circuits and systems. 2, Analog and digital signal processing (01.11.1997)
Published in IEEE transactions on circuits and systems. 2, Analog and digital signal processing (01.11.1997)
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Journal Article