Analytical V th Modeling for Dual-Gate MOSFETs With Independent Gate Control
Ghosh, Soumajit, Miura-Mattausch, M., Iizuka, T., Rahaman, Hafizur, Mattausch, H. J.
Published in IEEE transactions on electron devices (01.10.2022)
Published in IEEE transactions on electron devices (01.10.2022)
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Journal Article
Advanced Short-Channel-Effect Modeling With Applicability to Device Optimization-Potentials and Scaling
Avila Herrera, F., Hirano, Y., Miura-Mattausch, M., Iizuka, T., Kikuchihara, H., Mattausch, H. J., Ito, A.
Published in IEEE transactions on electron devices (01.09.2019)
Published in IEEE transactions on electron devices (01.09.2019)
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Journal Article
HiSIM_IGBT2: Modeling of the Dynamically Varying Balance Between MOSFET and BJT Contributions During Switching Operations
Tone, A., Miyaoku, Y., Miura-Mattausch, M., Kikuchihara, H., Feldmann, U., Saito, T., Mizoguchi, T., Yamamoto, T., Mattausch, H. J.
Published in IEEE transactions on electron devices (01.08.2019)
Published in IEEE transactions on electron devices (01.08.2019)
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Journal Article
Physically Based Compact Mobility Model for Organic Thin-Film Transistor
Maiti, T. K., Chen, L., Zenitani, H., Miyamoto, H., Miura-Mattausch, M., Mattausch, H. J.
Published in IEEE transactions on electron devices (01.05.2016)
Published in IEEE transactions on electron devices (01.05.2016)
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Journal Article
Investigation of the influence of processing conditions on the thermal, rheological and mechanical behavior of polypropylene nanocomposites
Mattausch, H., Laske, S., Đuretek, I., Kreith, J., Maier, G., Holzer, C.
Published in Polymer engineering and science (01.05.2013)
Published in Polymer engineering and science (01.05.2013)
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Journal Article
A Surface Potential Based Organic Thin-Film Transistor Model for Circuit Simulation Verified With DNTT High Performance Test Devices
Maiti, T. K., Hayashi, T., Chen, L., Mori, H., Kang, M. J., Takimiya, K., Miura-Mattausch, M., Mattausch, H. J.
Published in IEEE transactions on semiconductor manufacturing (01.05.2014)
Published in IEEE transactions on semiconductor manufacturing (01.05.2014)
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Journal Article
Compact modeling of GaN HEMT based on device-internal potential distribution
Okada, Y., Tanimoto, Y., Mizoguchi, T., Zenitani, H., Kikuchihara, H., Mattausch, H. J., Miura-Mattausch, M.
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
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Conference Proceeding
Journal Article
Operating-Condition Optimization of MG-MOSFETs for Low-Voltage Application
Ghosh, Soumajit, Miura-Mattausch, Mitiko, Iizuka, Takahiro, Rahaman, Hafizur, Mattausch, H. J.
Published in 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (06.03.2022)
Published in 2022 6th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) (06.03.2022)
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Conference Proceeding
A cost-efficient high-performance dynamic TCAM with pipelined hierarchical searching and shift redundancy architecture
Noda, H., Inoue, K., Kuroiwa, M., Igaue, F., Yamamoto, K., Mattausch, H.J., Koide, T., Amo, A., Hachisuka, A., Soeda, S., Hayashi, I., Morishita, F., Dosaka, K., Arimoto, K., Fujishima, K., Anami, K., Yoshihara, T.
Published in IEEE journal of solid-state circuits (01.01.2005)
Published in IEEE journal of solid-state circuits (01.01.2005)
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Journal Article
Conference Proceeding
Modeling of electrostatically actuated fluid flow system for mixed-domain simulation
Maiti, T. K., Chen, L., Miyamoto, H., Miura-Mattausch, M., Mattausch, H. J.
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
Published in 2015 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2015)
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Conference Proceeding
Journal Article
Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits
Miura-Mattausch, M., Miyamoto, H., Kikuchihara, H., Navarro, D., Maiti, T. K., Rohbani, N., Ma, C., Mattausch, H. J., Schiffmann, A., Steinmair, A., Seebacher, E.
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)
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Conference Proceeding
HiSIM-SOI: Complete surface-potential-based model valid for all SOI-structure types
Miura-Mattausch, M, Amakawa, S, Miyake, M, Kikuchihara, H, Baba, S, Mattausch, H J
Published in 2010 IEEE International SOI Conference (SOI) (01.10.2010)
Published in 2010 IEEE International SOI Conference (SOI) (01.10.2010)
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Conference Proceeding
Physical modeling of the reverse-short-channel effect for circuit simulation
Miura-Mattausch, M., Suetake, M., Mattausch, H.J., Kumashiro, S., Shigyo, N., Odanaka, S., Nakayama, N.
Published in IEEE transactions on electron devices (01.10.2001)
Published in IEEE transactions on electron devices (01.10.2001)
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Journal Article
Compact reliability model for degradation of advanced p-MOSFETs due to NBTI and hot-carrier effects in the circuit simulation
Ma, C., Mattausch, H. J., Miyake, M., Iizuka, T., Miura-Mattausch, M., Matsuzawa, K., Yamaguchi, S., Hoshida, T., Imade, M., Koh, R., Arakawa, T., He, J.
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
Published in 2013 IEEE International Reliability Physics Symposium (IRPS) (01.04.2013)
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Conference Proceeding
Modeling of 2D bias control in overlap region of high-voltage MOSFETs for accurate device/circuit performance prediction
Tanaka, A, Oritsuki, Y, Kikuchihara, H, Miyake, M, Mattausch, H J, Miura-Mattausch, M, Liu, Y, Green, K
Published in 2010 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2010)
Published in 2010 International Conference on Simulation of Semiconductor Processes and Devices (01.09.2010)
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Conference Proceeding
Correlating Microscopic and Macroscopic Variation With Surface-Potential Compact Model
Mattausch, H.J., Sadachika, N., Yumisaki, A., Kaya, A., Imafuku, W., Johguchi, K., Koide, T., Miura-Mattausch, M.
Published in IEEE electron device letters (01.08.2009)
Published in IEEE electron device letters (01.08.2009)
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Journal Article