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Published in Materials Science Forum (24.05.2016)
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Failure Analysis of InP-Based Edge-Emitting Buried Heterostructure Laser Diodes Degraded by Forward-Biased Electrostatic Discharge Tests
Ichikawa, Hiroyuki, Matsukawa, Shinji, Hamada, Kotaro, Yamaguchi, Akira, Nakabayashi, Takashi
Published in Japanese Journal of Applied Physics (01.05.2009)
Published in Japanese Journal of Applied Physics (01.05.2009)
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Current-Induced Step Bunching on Vicinal Si(111) Studied by Light Scattering
Tatsuo Yoshinobu, Tatsuo Yoshinobu, Shinji Matsukawa, Shinji Matsukawa, Koichi Sudoh, Koichi Sudoh, Hiroshi Iwasaki, Hiroshi Iwasaki
Published in Japanese Journal of Applied Physics (01.04.2000)
Published in Japanese Journal of Applied Physics (01.04.2000)
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KITABAYASHI, HIROYUKI, WADA, KEIJI, YAMAMOTO, HIROFUMI, TAMASO, HIDETO, MATSUKAWA, SHINJI
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Year of Publication 25.02.2016
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YOSHIDA, SHIGERU, MEGURO, KIICHI, YOSHIDA, KATSUHITO, SEKI, YUICHIRO, MATSUKAWA, SHINJI
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YOSHIDA, SHIGERU, MEGURO, KIICHI, YOSHIDA, KATSUHITO, SEKI, YUICHIRO, MATSUKAWA, SHINJI
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Year of Publication 17.02.2011
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High-speed ASK transceiver based on the NRD-guide technology at 60-GHz band
Kuroki, F., Sugioka, M., Matsukawa, S., Ikeda, K., Yoneyama, T.
Published in IEEE transactions on microwave theory and techniques (01.06.1998)
Published in IEEE transactions on microwave theory and techniques (01.06.1998)
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Journal Article
Analysis on forward-biased electrostatic-discharge-induced degradation of InP-based buried heterostructure laser diodes
Ichikawa, H., Matsukawa, S., Hamada, K., Yamaguchi, A., Nakabayashi, T.
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
Published in 2009 IEEE International Reliability Physics Symposium (01.04.2009)
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