Reliability of charge trapping memories with high- k control dielectrics (Invited Paper)
Molas, G., Bocquet, M., Vianello, E., Perniola, L., Grampeix, H., Colonna, J.P., Masarotto, L., Martin, F., Brianceau, P., Gély, M., Bongiorno, C., Lombardo, S., Pananakakis, G., Ghibaudo, G., De Salvo, B.
Published in Microelectronic engineering (01.07.2009)
Published in Microelectronic engineering (01.07.2009)
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Journal Article
Conference Proceeding
Performance and Modeling of Si-Nanocrystal Double-Layer Memory Devices With High- k Control Dielectrics
Gay, G., Molas, G., Bocquet, M., Jalaguier, E., Gely, M., Masarotto, L., Colonna, J. P., Grampeix, H., Martin, F., Brianceau, P., Vidal, V., Kies, R., Baron, T., Ghibaudo, G., De Salvo, B.
Published in IEEE transactions on electron devices (01.04.2012)
Published in IEEE transactions on electron devices (01.04.2012)
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Journal Article
Double Si nanocrystal layers grown by RPCVD for non-volatile memory applications
Masarotto, L, Molas, G, Jalaguier, E, Gay, G, Colonna, J P, Hartmann, J M, Yckache, K
Published in Semiconductor science and technology (01.02.2011)
Published in Semiconductor science and technology (01.02.2011)
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Journal Article
Reduced pressure–chemical vapor deposition of high Ge content Si/SiGe superlattices for 1.3 μm photo-detection
Masarotto, L, Hartmann, J.M, Bremond, G, Rolland, G, Papon, A.M, Séméria, M.N
Published in Journal of crystal growth (01.07.2003)
Published in Journal of crystal growth (01.07.2003)
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Journal Article
Transmission measurements of multilayer interference filters developed for a full integration on Complementary Metal Oxide Semiconductor chips
Masarotto, L., Frey, L., Charles, M.L., Roule, A., Rodriguez, G., Souil, R., Morales, C., Larrey, V.
Published in Thin solid films (01.06.2017)
Published in Thin solid films (01.06.2017)
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Journal Article
Performance and Modeling of Si-Nanocrystal Double-Layer Memory Devices With High- [Formula Omitted] Control Dielectrics
Gay, G, Molas, G, Bocquet, M, Jalaguier, E, Gely, M, Masarotto, L, Colonna, J. P, Grampeix, H, Martin, F, Brianceau, P, Vidal, V, Kies, R, Baron, T, Ghibaudo, G, De Salvo, B
Published in IEEE transactions on electron devices (01.04.2012)
Published in IEEE transactions on electron devices (01.04.2012)
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Journal Article
Hybrid silicon nanocrystals/SiN charge trapping layer with high-k dielectrics for FN and CHE programming
Gay, G, Molas, G, Bocquet, M, Jalaguier, E, Gely, M, Masarotto, L, Colonna, J P, Grampeix, H, Martin, F, Brianceau, P, Vidal, V, Kies, R, Bongiorno, C, Lombardo, S, Baron, T, Ghibaudo, G, De Salvo, B
Published in Proceedings of 2010 International Symposium on VLSI Technology, System and Application (01.04.2010)
Published in Proceedings of 2010 International Symposium on VLSI Technology, System and Application (01.04.2010)
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Conference Proceeding
Reliability of charge trapping memories with high-@@ik@ control dielectrics (Invited Paper)
Molas, G, Bocquet, M, Vianello, E, Perniola, L, Grampeix, H, Colonna, J P, Masarotto, L, Martin, F, Brianceau, P, Gely, M, Bongiorno, C, Lombardo, S, Pananakakis, G, Ghibaudo, G, De Salvo, B
Published in Microelectronic engineering (01.09.2009)
Published in Microelectronic engineering (01.09.2009)
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Journal Article
High performance polysilicon nanowire NEMS for CMOS embedded nanosensors
Ouerghi, I., Philippe, J., Duraffourg, L., Laurent, L., Testini, A., Benedetto, K., Charvet, A. M., Delaye, V., Masarotto, L., Scheiblin, P., Reita, C., Yckache, K., Ladner, C., Ludurczak, W., Ernst, T.
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
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Conference Proceeding
Thorough investigation of Si-nanocrystal memories with high-k interpoly dielectrics for sub-45nm node Flash NAND applications
Molas, G., Bocquet, M., Buckley, J., Colonna, J.P., Masarotto, L., Grampeix, H., Martin, F., Vidal, V., Toffoli, A., Brianceau, P., Vermande, L., Scheiblin, P., Gely, M., Papon, A.M., Auvert, G., Perniola, L., Licitra, C., Veyron, T., Rochat, N., Bongiorno, C., Lombardo, S., De Salvo, B., Deleonibus, S.
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
Published in 2007 IEEE International Electron Devices Meeting (01.12.2007)
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Conference Proceeding
Performance and reliability of a 4Mb Si nanocrystal NOR Flash memory with optimized 1T memory cells
Gerardi, C., Molas, G., Albini, G., Tripiciano, E., Gely, M., Emmi, A., Fiore, O., Nowak, E., Mello, D., Vecchio, M., Masarotto, L., Portoghese, R., De Salvo, B., Deleonibus, S., Maurelli, A.
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
Published in 2008 IEEE International Electron Devices Meeting (01.12.2008)
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Conference Proceeding
Performance and Reliability of Si-Nanocrystal Double Layer Memory Devices with High-k Control Dielectrics
Gay, G., Molas, G., Bocquet, M., Jalaguier, E., Gely, M., Masarotto, L., Colonna, J.P., Grampeix, H., Martin, F., Brianceau, P., Vidal, V., Kies, R., Yckache, K., De Salvo, B., Ghibaudo, G., Baron, T., Bongiorno, C., Lombardo, S.
Published in 2009 IEEE International Memory Workshop (01.05.2009)
Published in 2009 IEEE International Memory Workshop (01.05.2009)
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Conference Proceeding
Integration of Silicon Nanocrystal Memory Arrays with HfAlOx Based Interpoly Dielectric
Molas, G., Bocquet, M., Buckley, J., Grampeix, H., Colonna, J.P., Masarotto, L., Martin, F., Gely, M., De Salvo, B., Deleonibus, S., Golubovic, D.S., van Duuren, M.J., Bongiorno, C., Lombardo, S.
Published in 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design (01.05.2008)
Published in 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design (01.05.2008)
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Conference Proceeding