Self test apparatus for identifying partially defective memory
Huott, William V, Lund, David J, Marz, Kenneth H, Mechtly, Bryan L, Patel, Pradip
Year of Publication 08.11.2011
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Year of Publication 08.11.2011
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Self test apparatus for identifying partially defective memory
PATEL PRADIP, LUND DAVID J, MARZ KENNETH H, MECHTLY BRYAN L, HUOTT WILLIAM V
Year of Publication 08.11.2011
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Year of Publication 08.11.2011
Patent
Self Test Apparatus for Identifying Partially Defective Memory
PATEL PRADIP, LUND DAVID J, MARZ KENNETH H, MECHTLY BRYAN L, HUOTT WILLIAM V
Year of Publication 13.08.2009
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Year of Publication 13.08.2009
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Self test method and apparatus for identifying partially defective memory
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Year of Publication 29.04.2008
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Year of Publication 29.04.2008
Patent
Self test method and apparatus for identifying partially defective memory
Huott, William V, Lund, David J, Marz, Kenneth H, Mechtly, Bryan L, Patel, Pradip
Year of Publication 29.04.2008
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Year of Publication 29.04.2008
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Self test method and apparatus for identifying partially defective memory
PATEL PRADIP, LUND DAVID J, MARZ KENNETH H, MECHTLY BRYAN L, HUOTT WILLIAM V
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Year of Publication 13.07.2006
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