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MEASURING METHOD AND DEVICE FOR REALIZING QUICK, EXACT THERMOMETRIC ANALYSIS OF MATERIAL, PURPOSLY SERIAL ANALYSIS
by
MARIK
,
JANOSNE
,
HU
,
KERENYI,GYULA,HU
,
HORVATH,JOZSEF,HU
,
PROMMER,PAL,HU
Year of Publication
28.11.1988
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MEASURING METHOD AND DEVICE FOR REALIZING QUICK, EXACT THERMOMETRIC ANALYSIS OF MATERIAL, PURPOSLY SERIAL ANALYSIS
by
MARIK
,
JANOSNE
,
HU
,
KERENYI,GYULA,HU
,
HORVATH,JOZSEF,HU
,
PROMMER,PAL,HU
Year of Publication
28.01.1987
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Patent
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Patent
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Subject Area
chemistry
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physics
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sciences
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Topic
investigating or analysing materials by determining theirchemical or physical properties
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measuring
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physics
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testing
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English
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esp@cenet
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