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Year of Publication 13.07.2021
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METHOD FOR LARGE-AREA 3D ANALYSIS OF SAMPLES USING GLANCING INCIDENCE FIB MILLING
Botman, Aurelien Philippe Jean Maclou, Mani, Kenny, Rue, Chad, Wang, Jing, Kiss, Gabriella, Christian, Joe
Year of Publication 22.04.2021
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Year of Publication 22.04.2021
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METHOD FOR LARGE-AREA 3D ANALYSIS OF SAMPLES USING GLANCING INCIDENCE FIB MILLING
Botman, Aurélien Philippe Jean Maclou, Christian, Joseph, Mani, Kenny, Rue, Chad, Wang, Jing, Kiss, Gabriella
Year of Publication 21.04.2021
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Year of Publication 21.04.2021
Patent
FACE-ON, GAS-ASSISTED ETCHING FOR PLAN-VIEW LAMELLAE PREPARATION
Franco, Noel Thomas, Mani, Kenny, Rue, Chad, Christian, Joe, Blackwood, Jeffrey
Year of Publication 23.04.2020
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Year of Publication 23.04.2020
Patent
Face-on, gas-assisted etching for plan-view lamellae preparation
Franco, Noel Thomas, Mani, Kenny, Rue, Chad, Christian, Joe, Blackwood, Jeffrey
Year of Publication 28.01.2020
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Year of Publication 28.01.2020
Patent
FACE-ON, GAS-ASSISTED ETCHING FOR PLAN-VIEW LAMELLAE PREPARATION
Franco, Noel Thomas, Mani, Kenny, Rue, Chad, Christian, Joe, Blackwood, Jeffrey
Year of Publication 06.12.2018
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Year of Publication 06.12.2018
Patent
Developing functional Prototypes by package modification using plasma FIB technology
Gonzales, M., Cruz, R., Parley, M., Lau, J., DiBattista, M., Routh, B., Landin, T., Carleson, P., Huggins, E., Mani, K.
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)
Published in 2012 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (01.07.2012)
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