Nanoscale Thermal Transport in Vertical Gate- All-Around Junctionless Nanowire Transistors- Part II: Multiphysics Simulation
Rezgui, H., Mukherjee, C., Wang, Y., Deng, M., Kumar, A., Muller, J., Larrieu, G., Maneux, C.
Published in IEEE transactions on electron devices (01.12.2023)
Published in IEEE transactions on electron devices (01.12.2023)
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Journal Article
Nanoscale Thermal Transport in Vertical Gate-All-Around Junctionless Nanowire Transistors-Part I: Experimental Methods
Mukherjee, C., Rezgui, H., Wang, Y., Deng, M., Kumar, A., Muller, J., Larrieu, G., Maneux, C.
Published in IEEE transactions on electron devices (01.12.2023)
Published in IEEE transactions on electron devices (01.12.2023)
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SPICE Modeling in Verilog-A for Photo-response in UTC-photodiodes targeting Beyond-5G Circuit Design
Mukherjee, C., Guendouz, D., Deng, M., Bertin, H., Bobin, A., Vaissiere, N., Caillaud, C., Arabhavi, A. M., Chaudhary, R., Ostinelli, O., Bolognesi, C., Mounaix, P., Maneux, C.
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Published in IEEE transactions on computer-aided design of integrated circuits and systems (01.09.2023)
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Impact of Hot Carrier Degradation on the Performances of Current Mirrors based on a 55 nm BiCMOS Integrated Circuit Technology
Mukherjee, C., Couret, M., Maneux, C., Celi, D.
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
Published in ESSDERC 2021 - IEEE 51st European Solid-State Device Research Conference (ESSDERC) (13.09.2021)
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CNTFET Modeling and Reconfigurable Logic-Circuit Design
O'Connor, I., Liu Junchen, Gaffiot, F., Pregaldiny, F., Lallement, C., Maneux, C., Goguet, J., Fregonese, S., Zimmer, T., Anghel, L., Trong-Trinh Dang, Leveugle, R.
Published in IEEE transactions on circuits and systems. I, Regular papers (01.11.2007)
Published in IEEE transactions on circuits and systems. I, Regular papers (01.11.2007)
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Implementation of Tunneling Phenomena in a CNTFET Compact Model
Fregonese, S., Maneux, C., Zimmer, T.
Published in IEEE transactions on electron devices (01.10.2009)
Published in IEEE transactions on electron devices (01.10.2009)
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First Uni-Traveling Carrier Photodiode Compact Model Enabling Future Terahertz Communication System Design
Mukherjee, C., Mounaix, P., Maneux, C., Natrella, M., Seddon, J., Graham, C., Renaud, C. C.
Published in ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) (01.09.2019)
Published in ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) (01.09.2019)
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Characterization and Modeling of Graphene Transistor Low-Frequency Noise
Grandchamp, B., Fregonese, S., Majek, C., Hainaut, C., Maneux, C., Meng, N., Happy, H., Zimmer, T.
Published in IEEE transactions on electron devices (01.02.2012)
Published in IEEE transactions on electron devices (01.02.2012)
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Electrical Behavior and Technology Optimization of Si/SiGeC HBTs on Thin-Film SOI
Avenier, G., Fregonese, S., Chevalier, P., Bustos, J., Saguin, F., Schwartzmann, T., Maneux, C., Zimmer, T., Chantre, A.
Published in IEEE transactions on electron devices (01.02.2008)
Published in IEEE transactions on electron devices (01.02.2008)
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Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses
Koné, G.A., Grandchamp, B., Hainaut, C., Marc, F., Maneux, C., Labat, N., Zimmer, T., Nodjiadjim, V., Riet, M., Godin, J.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Investigation of the degradation mechanisms of InP/InGaAs DHBT under bias stress conditions to achieve electrical aging model for circuit design
Ghosh, S., Grandchamp, B., Koné, G.A., Marc, F., Maneux, C., Zimmer, T., Nodjiadjim, V., Riet, M., Dupuy, J.-Y., Godin, J.
Published in Microelectronics and reliability (01.09.2011)
Published in Microelectronics and reliability (01.09.2011)
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Rosenbaum, T., Saxod, O., Vu, V. T., Celi, D., Chevalier, P., Schroter, M., Maneux, C.
Published in 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM (01.10.2015)
Published in 2015 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM (01.10.2015)
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Preliminary results of storage accelerated aging test on InP/InGaAs DHBT
Koné, G.A., Grandchamp, B., Hainaut, C., Marc, F., Maneux, C., Labat, N., Zimmer, T., Nodjiadjim, V., Godin, J.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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A compact model for SiGe HBT on thin-film SOI
Fregonese, S., Avenier, G., Maneux, C., Chantre, A., Zimmer, T.
Published in IEEE transactions on electron devices (01.02.2006)
Published in IEEE transactions on electron devices (01.02.2006)
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Thermal aging model of InP/InGaAs/InP DHBT
Ghosh, S., Marc, F., Maneux, C., Grandchamp, B., Koné, G.A., Zimmer, T.
Published in Microelectronics and reliability (01.09.2010)
Published in Microelectronics and reliability (01.09.2010)
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InP DHBT On-Wafer RF Characterization and Small-Signal Modelling up to 220 GHz
Davy, N., Deng, M., Nodjiadjim, V., Mukherjee, C., Riet, M., Mismer, C., Ardouin, B., Maneux, C.
Published in 2023 18th European Microwave Integrated Circuits Conference (EuMIC) (18.09.2023)
Published in 2023 18th European Microwave Integrated Circuits Conference (EuMIC) (18.09.2023)
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Modeling of a novel NPN-SiGe-HBT device structure using strain engineering technology in the collector region for enhanced electrical performance
Al-Sa'di, M, Fregonese, S, Maneux, C, Zimmer, T
Published in 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) (01.10.2010)
Published in 2010 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) (01.10.2010)
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Adessi, C., Avriller, R., Blase, X., Bournel, A., Cazin d'Honincthun, H., Dollfus, P., Frégonèse, S., Galdin-Retailleau, S., López-Bezanilla, A., Maneux, C., Nha Nguyen, H., Querlioz, D., Roche, S., Triozon, F., Zimmer, T.
Published in Comptes rendus. Physique (01.05.2009)
Published in Comptes rendus. Physique (01.05.2009)
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Fregonese, S., Avenier, G., Maneux, C., Chantre, A., Zimmer, T.
Published in Solid-state electronics (01.11.2006)
Published in Solid-state electronics (01.11.2006)
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Nanoscale Thermal Transport in Vertical Gateall-around Junction-less Nanowire Transistors-Part II: Multiphysics Simulation
Rezgui, H., Chhandak, Mukherjee, Wang, Y., Deng, M., Kumar, A., Müller, J., Larrieu, G., Maneux, C.
Published in IEEE transactions on electron devices (01.12.2023)
Published in IEEE transactions on electron devices (01.12.2023)
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Journal Article