Effect of passivation on stress relaxation in electroplated copper films
Gan, Dongwen, Ho, Paul S., Pang, Yaoyu, Huang, Rui, Leu, Jihperng, Maiz, Jose, Scherban, Tracey
Published in Journal of materials research (01.06.2006)
Published in Journal of materials research (01.06.2006)
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Journal Article
Measurements and analysis of SER-tolerant latch in a 90-nm dual-V/T/ CMOS process
Hazucha, P, Karnik, T, Walstra, S, Bloechel, B A, Tschanz, J W, Maiz, J, Soumyanath, K, Dermer, G E, Narendra, S, De, V, Borkar, S
Published in IEEE journal of solid-state circuits (01.09.2004)
Published in IEEE journal of solid-state circuits (01.09.2004)
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Journal Article
HIGH DOSE RADIATION DETECTOR
YANG XIAOFENG, GILL BALKARAN SINGH, MAIZ JOSE A, SEIFERT NORBERT R, KORNFELD AVNER
Year of Publication 28.08.2014
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Year of Publication 28.08.2014
Patent
Effect of BTI Degradation on Transistor Variability in Advanced Semiconductor Technologies
Sangwoo Pae, Maiz, J., Prasad, C., Woolery, B.
Published in IEEE transactions on device and materials reliability (01.09.2008)
Published in IEEE transactions on device and materials reliability (01.09.2008)
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Magazine Article
Effects of Passivation Layer on Stress Relaxation and Mass Transport in Electroplated Cu Films
Gan, Dongwen, Ho, Paul S., Huang, Rui, Leu, Jihperng, Maiz, Jose, Scherban, Tracey
Published in AIP conference proceedings (08.12.2004)
Published in AIP conference proceedings (08.12.2004)
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Journal Article
Measurements and analysis of SER-tolerant latch in a 90-nm Dual-VT CMOS process
HAZUCHA, Peter, KARNIK, Tanay, BORKAR, Shekhar, WALSTRA, Steven, BLOECHEL, Bradley A, TSCHANZ, James W, MAIZ, Jose, SOUMYANATH, Krishnamurthy, DERMER, Gregory E, NARENDRA, Siva, DE, Vivek
Published in IEEE journal of solid-state circuits (01.09.2004)
Published in IEEE journal of solid-state circuits (01.09.2004)
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Journal Article
High dose radiation detector
Maiz Jose A, Yang Xiaofeng, Seifert Norbert R, Gill Balkaran Singh, Kornfeld Avner
Year of Publication 27.06.2017
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Year of Publication 27.06.2017
Patent
Vorrichtung und System mit Detektoren für hohe Strahlendosen
Seifert, Norbert R, Gill, Balkaran, Kornfeld, Avner, Maiz, Jose A, Yang, Xiaofeng
Year of Publication 27.01.2022
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Year of Publication 27.01.2022
Patent