Nanocrystals for silicon-based light-emitting and memory devices
Ray, S K, Maikap, S, Banerjee, W, Das, S
Published in Journal of physics. D, Applied physics (17.04.2013)
Published in Journal of physics. D, Applied physics (17.04.2013)
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Journal Article
Unleashing Endurance Limits of Emerging Memory: Multi-Level FeRAM Recovery Array Empowered by a Coordinated Inverting Amplifier Circuit
Hsiang, K.-Y., Chang, F.-S., Lou, Z.-F., Aich, A., Senapati, A., Lee, J.-Y., Li, Z.-X., Chen, J.-H., Liu, C.-H., Liu, C. W., Maikap, S., Su, P., Hou, T.-H., Lee, M. H.
Published in IEEE transactions on electron devices (01.04.2024)
Published in IEEE transactions on electron devices (01.04.2024)
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Journal Article
Impact of TaOx nanolayer at the GeSex/W interface on resistive switching memory performance and investigation of Cu nanofilament
Rahaman, S. Z., Maikap, S., Chen, W. S., Lee, H. Y., Chen, F. T., Tien, T. C., Tsai, M. J.
Published in Journal of applied physics (15.03.2012)
Published in Journal of applied physics (15.03.2012)
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Journal Article
Charge trapping characteristics of atomic-layer-deposited HfO2 films with Al2O3 as a blocking oxide for high-density non-volatile memory device applications
Maikap, S, Lee, H Y, Wang, T-Y, Tzeng, P-J, Wang, C C, Lee, L S, Liu, K C, Yang, J-R, Tsai, M-J
Published in Semiconductor science and technology (01.08.2007)
Published in Semiconductor science and technology (01.08.2007)
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Journal Article
Bipolar resistive switching memory using bilayer TaOx/WOx films
Prakash, A., Maikap, S., Lai, C.S., Tien, T.C., Chen, W.S., Lee, H.Y., Chen, F.T., Kao, M.-J., Tsai, M.-J.
Published in Solid-state electronics (01.11.2012)
Published in Solid-state electronics (01.11.2012)
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Journal Article
Conference Proceeding
Ge outdiffusion effect on flicker noise in strained-Si nMOSFETs
Hua, W.-C., Lee, M.H., Chen, P.S., Maikap, S., Liu, C.W., Chen, K.M.
Published in IEEE electron device letters (01.10.2004)
Published in IEEE electron device letters (01.10.2004)
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Journal Article
High-k gate oxide for silicon heterostructure MOSFET devices
Ray, S K, Mahapatra, R, Maikap, S
Published in Journal of materials science. Materials in electronics (01.09.2006)
Published in Journal of materials science. Materials in electronics (01.09.2006)
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Journal Article
Characteristics of strained-germanium p- and n-channel field effect transistors on a Si (1 1 1) substrate
Maikap, S, Lee, M H, Chang, S T, Liu, C W
Published in Semiconductor science and technology (01.04.2007)
Published in Semiconductor science and technology (01.04.2007)
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Journal Article
High Ge Content of SiGe Channel pMOSFETs on Si (110) Surfaces
Lee, M.H., Chang, S.T., Maikap, S., Peng, C.-Y., Lee, C.-H.
Published in IEEE electron device letters (01.02.2010)
Published in IEEE electron device letters (01.02.2010)
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Journal Article
Characteristics of pH sensors fabricated by using protein-mediated CdSe/ZnS quantum dots
Maikap, S., Prakash, A., Banerjee, W., Das, Anirban, Lai, C.-S.
Published in Microelectronics and reliability (01.05.2010)
Published in Microelectronics and reliability (01.05.2010)
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Journal Article
Abnormal hole mobility of biaxial strained Si
Liao, M. H., Chang, S. T., Lee, M. H., Maikap, S., Liu, C. W.
Published in Journal of applied physics (15.09.2005)
Published in Journal of applied physics (15.09.2005)
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Journal Article
Studying the impact of carbon on device performance for strained-Si MOSFETs
Lee, M.H., Chang, S.T., Peng, C.-Y., Hsieh, B.-F., Maikap, S., Liao, S.-H.
Published in Thin solid films (03.11.2008)
Published in Thin solid films (03.11.2008)
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Journal Article
Conference Proceeding
Ruthenium oxide metal nanocrystal capacitors with high- κ dielectric tunneling barriers for nanoscale nonvolatile memory device applications
Das, Atanu, Maikap, S., Lin, C.-H., Tzeng, P.-J., Tien, T.-C., Wang, T.-Y., Chang, L.-B., Yang, J.-R., Tsai, M.-J.
Published in Microelectronic engineering (01.10.2010)
Published in Microelectronic engineering (01.10.2010)
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Journal Article
Short channel effect improved strained-Si:C-source/drain PMOSFETs
Lee, M.H., Chang, S.T., Maikap, S., Shen, K.-W., Wang, W.-C.
Published in Applied surface science (30.07.2008)
Published in Applied surface science (30.07.2008)
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Journal Article
Conference Proceeding