Effects of Threshold Voltage Variations on Single-Event Upset Response of Sequential Circuits at Advanced Technology Nodes
Hangfang Zhang, Hui Jiang, Assis, Thiago R., Mahatme, Nihaar N., Narasimham, Balaji, Massengill, Lloyd W., Bhuva, Bharat L., Shi-Jie Wen, Wong, Richard
Published in IEEE transactions on nuclear science (01.01.2017)
Published in IEEE transactions on nuclear science (01.01.2017)
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Journal Article
Single-Event Charge Collection and Upset in 40-nm Dual- and Triple-Well Bulk CMOS SRAMs
Chatterjee, I., Narasimham, B., Mahatme, N. N., Bhuva, B. L., Schrimpf, R. D., Wang, J. K., Bartz, B., Pitta, E., Buer, M.
Published in IEEE transactions on nuclear science (01.12.2011)
Published in IEEE transactions on nuclear science (01.12.2011)
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Journal Article
Impact of Strained-Si PMOS Transistors on SRAM Soft Error Rates
Mahatme, Nihaar N., Bhuva, Bharat L., Fang, Yi-Pin, Oates, Anthony S.
Published in IEEE transactions on nuclear science (01.08.2012)
Published in IEEE transactions on nuclear science (01.08.2012)
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Journal Article
An efficient technique to select logic nodes for single event transient pulse-width reduction
Mahatme, Nihaar N., Chatterjee, Indranil, Patki, Akash, Limbrick, Daniel B., Bhuva, Bharat L., Schrimpf, Ronald D., Robinson, William
Published in Microelectronics and reliability (01.01.2013)
Published in Microelectronics and reliability (01.01.2013)
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Journal Article
Reliability-Aware Synthesis of Combinational Logic With Minimal Performance Penalty
Limbrick, Daniel B., Mahatme, N. N., Robinson, W. H., Bhuva, B. L.
Published in IEEE transactions on nuclear science (01.08.2013)
Published in IEEE transactions on nuclear science (01.08.2013)
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Journal Article
High-speed pulsed-hysteresis-latch design for improved SER performance in 20 nm bulk CMOS process
Narasimham, Balaji, Chandrasekharan, Karthik, Wang, Jung K., Djaja, Gregory, Gaspard, Nelson J., Mahatme, Nihaar N., Assis, Thiago R., Bhuva, Bharat L.
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
Published in 2014 IEEE International Reliability Physics Symposium (01.06.2014)
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