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"MAENO HIDESHI"
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"MAENO HIDESHI"
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SHIFT REGISTER CIRCUIT
by
MAENO HIDESHI
,
OOSAWA TOKUYA
Year of Publication
14.01.1994
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222
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SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE
by
SAKAYANAGI SHIGEO
,
MAENO HIDESHI
Year of Publication
10.12.1993
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JPH05299505
by
SAKAYANAGI SHIGEO
,
MAENO HIDESHI
Year of Publication
12.11.1993
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224
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JPH05290577
by
ARAI KOJI
,
MAENO HIDESHI
Year of Publication
05.11.1993
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225
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JPH0521431B
by
MAENO HIDESHI
,
TADA TETSUO
Year of Publication
24.03.1993
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SEMICONDUCTOR INTEGRATED CIRCUIT
by
MAENO HIDESHI
,
OSAWA NOBUYUKI
Year of Publication
21.12.1992
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SEMICONDUCTOR INTEGRATED CIRCUIT
by
OKUDA RYOSUKE
,
MAENO HIDESHI
Year of Publication
04.11.1992
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SEMICONDUCTOR INTEGRATED CIRCUIT HAVING BUILT-IN MEMORY
by
MAENO HIDESHI
,
SATO HISAYASU
Year of Publication
18.07.1990
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SEMICONDUCTOR INTEGRATED CIRCUIT INCORPORATED IN MEMORY
by
MAENO HIDESHI
,
SATO HISAYASU
Year of Publication
19.04.1990
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SEMICONDUCTOR TESTING SYSTEM
by
MAENO HIDESHI
,
DADA DETSUO
Year of Publication
11.04.1990
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Semiconductor test device
by
TADA; TETSUO
,
MAENO
;
HIDESHI
Year of Publication
14.03.1989
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Testing apparatus for semiconductor device
by
TADA; TETSUO
,
MAENO
;
HIDESHI
Year of Publication
31.01.1989
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TEST ASSISTING CIRCUIT
by
HANIBUCHI TOSHIAKI
,
MAENO HIDESHI
Year of Publication
17.08.1988
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SEMICONDUCTOR TESTER
by
MAENO HIDESHI
,
TADA TETSUO
Year of Publication
10.12.1987
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LSI MODULE
by
MAENO HIDESHI
,
TADA TETSUO
Year of Publication
13.11.1987
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SEMICONDUCTOR TESTING DEVICE
by
MAENO HIDESHI
,
TADA TETSUO
Year of Publication
28.08.1987
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Semiconductor device
by
{OVERSCORE (O)}SAWA TOKUYA
,
MAENO HIDESHI
Year of Publication
04.09.2001
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238
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Test circuit and a redundancy circuit for an internal memory circuit
by
{OVERSCORE (O)}SAWA TOKUYA
,
MAENO HIDESHI
Year of Publication
14.08.2001
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SEMICONDUCTOR TESTER
by
MAENO HIDESHI
,
TADA TETSUO
Year of Publication
27.03.1987
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Semiconductor storage device with testing and redundant function
by
OSAWA NORIYA
,
MAENO HIDESHI
Year of Publication
28.07.2004
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