FF-Control Point Insertion (FF-CPI) to Overcome the Degradation of Fault Detection under Multi-Cycle Test for POST
Al-AWADHI, Hanan T., AONO, Tomoki, WANG, Senling, HIGAMI, Yoshinobu, TAKAHASHI, Hiroshi, IWATA, Hiroyuki, MAEDA, Yoichi, MATSUSHIMA, Jun
Published in IEICE Transactions on Information and Systems (01.11.2020)
Published in IEICE Transactions on Information and Systems (01.11.2020)
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Journal Article
Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST
Wang, Senling, Aono, Tomoki, Higami, Yoshinobu, Takahashi, Hiroshi, Iwata, Hiroyuki, Maeda, Yoichi, Matsushima, Jun
Published in 2018 IEEE 27th Asian Test Symposium (ATS) (01.10.2018)
Published in 2018 IEEE 27th Asian Test Symposium (ATS) (01.10.2018)
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Conference Proceeding
A Case Study Using ICT in Social Education Facilities: Teaching practice of collaborative learning with different generations and a curator
MUKO, Heiwa, SUMIDA, Manabu, MAEDA, Yoichi, MIYAUCHI, Keisuke, IKEDA, Takaaki, INABA, Masakazu
Published in Journal of Science Education in Japan (2019)
Published in Journal of Science Education in Japan (2019)
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Journal Article
Locus of viewpoints from which a conic appears circular
Kishine, Makoto, Maeda, Yoichi
Published in The electronic journal of mathematics & technology (01.06.2023)
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Published in The electronic journal of mathematics & technology (01.06.2023)
Journal Article
A proposal of traffic control mechanism in PON based access system
Iwata, Toshiyuki, Nakanishi, Yasuhiko, Maeda, Yoichi
Published in Electronics & Communications in Japan. Part 2, Electronics (01.07.2007)
Published in Electronics & Communications in Japan. Part 2, Electronics (01.07.2007)
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Journal Article
Fair bandwidth allocation method for broadband packet network
Yoshida, Yukihiro, Kasahara, Yasunobu, Maeda, Yoichi
Published in Electronics & communications in Japan. Part 1, Communications (01.08.2007)
Published in Electronics & communications in Japan. Part 1, Communications (01.08.2007)
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Journal Article
A Power Reduction Method for Scan Testing in Ultra-Low Power Designs
Iwata, Hiroyuki, Maeda, Yoichi, Matsushima, Jun
Published in 2021 IEEE 30th Asian Test Symposium (ATS) (01.11.2021)
Published in 2021 IEEE 30th Asian Test Symposium (ATS) (01.11.2021)
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Conference Proceeding