Ballisticity Saturation by Unscalable Reflections
Pourghaderi, M. Ali, Ilatikhameneh, Hesameddin, Pham, Anh-Tuan, Park, Hong-Hyun, Lim, Jinyoung, Jiang, Zhengping, Wang, Jing, Jin, Seonghoon, Kim, Jongchol, Kwon, Uihui, Chung, Won-Young, Choi, Woosung, Kim, Dae Sin
Published in IEEE electron device letters (01.07.2020)
Published in IEEE electron device letters (01.07.2020)
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Journal Article
Critical Backscattering Length in Nanotransistors
Pourghaderi, M. Ali, Pham, Anh-Tuan, Park, Hong-Hyun, Jin, Seonghoon, Vuttivorakulchai, Kantawong, Park, Yonghee, Kwon, Uihui, Choi, Woosung, Kim, Dae Sin
Published in IEEE electron device letters (01.02.2022)
Published in IEEE electron device letters (01.02.2022)
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Journal Article
Universality of Short-Channel Effects on Ultrascaled MOSFET Performance
Pourghaderi, M. Ali, Pham, Anh-Tuan, Ilatikhameneh, Hesameddin, Kim, Jongchol, Park, Hong-Hyun, Jin, Seonghoon, Chung, Won-Young, Choi, Woosung, Maeda, Shigenobu, Lee, Keun-Ho
Published in IEEE electron device letters (01.02.2018)
Published in IEEE electron device letters (01.02.2018)
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Journal Article
Nonparabolicity and confinement effects of IIIV materials in novel transistors
Pourghaderi, M. Ali, Mocuta, Anda, Thean, Aaron
Published in 2015 International Conference on IC Design & Technology (ICICDT) (01.06.2015)
Published in 2015 International Conference on IC Design & Technology (ICICDT) (01.06.2015)
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Conference Proceeding
Ultimate nano-electronics: New materials and device concepts for scaling nano-electronics beyond the Si roadmap
Collaert, N., Alian, A., Arimura, H., Boccardi, G., Eneman, G., Franco, J., Ivanov, Ts, Lin, D., Loo, R., Merckling, C., Mitard, J., Pourghaderi, M.A., Rooyackers, R., Sioncke, S., Sun, J.W., Vandooren, A., Veloso, A., Verhulst, A., Waldron, N., Witters, L., Zhou, D., Barla, K., Thean, A.V.-Y.
Published in Microelectronic engineering (25.01.2015)
Published in Microelectronic engineering (25.01.2015)
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Journal Article
Rapid assessment of food insecurity in the urban households in Karaj
A. Afshar, M. Pourghaderi, SS. Hakim, AA. Safari, H. Barati
Published in The Journal of Qazvin University of Medical Sciences (01.06.2018)
Published in The Journal of Qazvin University of Medical Sciences (01.06.2018)
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Journal Article
Nanoscale-nMOSFET junction design: Quantum transport approach
Pourghaderi, M. Ali, Chulwoo Park, Jongchol Kim, Changwook Jeong, Won-Young Chung, Keun-Ho Lee, Hong-Hyun Park, Anh-Tuan Pham, Seonghoon Jin, Woosung Choi
Published in 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2017)
Published in 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (01.09.2017)
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Conference Proceeding
A new method to calculate leakage current and its applications for sub-45nm MOSFETs
Lujan, G.S., Magnus, W., Soree, B., Pourghaderi, M.A., Veloso, A., van Da, M.J.H., Lauwers, A., Kubicek, S., De Gendt, S., Heyns, M., De Meyer, K.
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
Published in Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005 (2005)
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Conference Proceeding
BTI reliability of high-mobility channel devices: SiGe, Ge and InGaAs
Franco, J., Kaczer, B., Roussel, J., Cho, M., Grasser, T., Mitard, J., Arimura, H., Witters, L., Cott, D., Waldron, N., Zhou, D., Vais, A., Lin, D., Alian, A., Pourghaderi, M. A., Martens, K., Sioncke, S., Collaert, N., Thean, A., Heyns, M., Groeseneken, G.
Published in 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) (01.10.2014)
Published in 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) (01.10.2014)
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Conference Proceeding
Theoretical Limit of TiSi2 Contact Resistance : Note: Sub-titles are not captured in Xplore and should not be used
Jeong, M. Y., Pourghaderi, M. A., Vuttivorakulchai, K., Song, S., Kim, Y.-S., Voros, M., Jin, S., Lee, B., Choi, W., Kwon, U., Kim, D. S.
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
Published in 2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) (27.09.2023)
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Conference Proceeding
RTN and PBTI-induced time-dependent variability of replacement metal-gate high-k InGaAs FinFETs
Franco, J., Kaczer, B., Waldron, N., Roussel, J., Alian, A., Pourghaderi, M. A., Ji, Z., Grasser, T., Kauerauf, T., Sioncke, S., Collaert, N., Thean, A., Groeseneken, G.
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
Published in 2014 IEEE International Electron Devices Meeting (01.12.2014)
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Conference Proceeding
Universal Swing Factor Approach For Performance Analysis Of Logic Nodes
Pourghaderi, M. Ali, Pham, Anh-Tuan, Kim, Seungkyu, Chung, Hyein, Jiang, Zhengping, Ilatikhameneh, Hesameddin, Park, Hong-hyun, Jin, Seonghoon, Kim, Jongchol, Chung, Won-Young, Kwon, Uihui, Choi, Woosung, Kim, Dae Sin, Maeda, Shigenobu
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
Published in 2018 IEEE International Electron Devices Meeting (IEDM) (01.12.2018)
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Conference Proceeding
Rapid assessment of food insecurity in the urban households in Karaj
Afshar, A., Pourghaderi, M., Hakim, SS, Safari, AA, Barati, H.
Published in Majallah-i dānishgāh-i ʻulūm-i pizishkī-i Qazvīn (01.06.2018)
Published in Majallah-i dānishgāh-i ʻulūm-i pizishkī-i Qazvīn (01.06.2018)
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Journal Article
Key Issues for the Development of a Ge CMOS Device in an Advanced IC Circuit
Meuris, Marc M., Martens, K., De Jaegar, B., Van Steenbergen, J., Bonzom, Renaud, Caymax, Matty R., Houssa, M., Kaczer, Ben, Leys, Frederik, Nelis, Daniel, Opsomer, Karl, Pourghaderi, A. M., Satta, A., Simoen, Eddy R., Terzieva, Valentina, Souriau, Laurent, Bellenger, F., Brammertz, Guy, Nicholas, G., Scarozza, M., Huyghebaert, C., Winderickx, Gillis, Loo, Roger, Clarysse, Trudo, Conard, Thierry, Bender, Hugo, Benedetti, Alessandro, Todi, R., Delabie, A., Hellin, David, Van Daele, Benny, Sioncke, Sonja, Mertens, Paul W., De Meyer, Krtistien, Van Elshocht, Sven, Vandervorst, Wilfried, Zimmerman, Paul, Brunco, David P., Heyns, Marc M.
Published in ECS transactions (20.10.2006)
Published in ECS transactions (20.10.2006)
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Journal Article