The Degradation and Recovery of 1200-V SiC MOSFET with Different Total Ionizing Doses
Zhang, Yuan-Lan, Duan, Yu-Han, Luo, Run-Ding, Lei, Guang-Yin, Sun, Bo-Tao, Wang, Hai-Ting, Liu, Pan, Zhang, Qingchun Jon
Published in 2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS) (27.11.2023)
Published in 2023 20th China International Forum on Solid State Lighting & 2023 9th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS) (27.11.2023)
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