Short-Flow Compatible Wafer-Level Reliability Assessment and Monitoring for PCM Embedded Non-Volatile Memory
Lunenborg, Meindert, Brozek, Tomasz, Lorenzi, Laura, Dolainsky, Christoph, Liu, Violet, Feng, Xiaoyi
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
Published in 2023 IEEE International Reliability Physics Symposium (IRPS) (01.03.2023)
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Conference Proceeding
Evaluation of Truly Passive Crossbar Memory Arrays on Short Flow Characterization Vehicle Test Chips
Hess, Christopher, Brozek, Tomasz, Schneider, Hendrik, Yu, Yuan, Lunenborg, Meindert, Ng, Khim Hong, Ciplickas, Dennis, Vallishayee, Rakesh, Dolainsky, Christoph, Weiland, Larg H.
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01.03.2019)
Published in 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) (01.03.2019)
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Conference Proceeding
Characterization Challenges and Solutions for FDSOI Technologies
Brozek, Tomasz, Lunenborg, Meindert, Arnaud, Franck, Gonella, Roberto, Giraudin, Jean-Christophe, Dutto, Christian, Martinet, Bertrand, Garchery, Laurent, Hess, Christopher, Doong, Kelvin
Published in 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (14.10.2019)
Published in 2019 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S) (14.10.2019)
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Conference Proceeding
Passive array test structure for cross-point memory characterization
Lunenborg, Meindert, Ng, SiewHoon, Vallishayee, Rakesh, Schneider, Hendrik, Brozek, Tomasz, Joag, Amit, Yu, Yuan, Hess, Christopher
Year of Publication 05.05.2020
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Year of Publication 05.05.2020
Patent
Impact of layout at advanced technology nodes on the performance and variation of digital and analog figures of merit
Saxena, Sharad, Dolainsky, Christoph, Lunenborg, Meindert, Jianjun Cheng, Yu, Bob, Vallishayee, Rakesh, Ciplickas, Dennis
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
Published in 2013 IEEE International Electron Devices Meeting (01.12.2013)
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Conference Proceeding
Journal Article
TEST STRUCTURES FOR MEASURING SILICON THICKNESS IN FULLY DEPLETED SILICON-ON-INSULATOR TECHNOLOGIES
Brozek Thomas, Pak Mike Kyu Hyon, Lunenborg Meindert Martin, Yu Yuan, Saxena Sharad
Year of Publication 26.10.2017
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Year of Publication 26.10.2017
Patent