Dealing with hot-carrier aging in nMOS and DMOS, models, simulations and characterizations
Mouthaan, A.J, Salm, C, Lunenborg, M.M, de Wolf, M.A.R.C, Kuper, F.G
Published in Microelectronics and reliability (01.06.2000)
Published in Microelectronics and reliability (01.06.2000)
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Journal Article
Comprehensive physical modeling of nmosfet hot-carrier-induced degradation
Lunenborg, M.M., De Graaff, H.C., Mouthaan, A.J., Verweij Mesa, J.F.
Published in Microelectronics and reliability (01.11.1996)
Published in Microelectronics and reliability (01.11.1996)
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Journal Article
Conference Proceeding
Anomalous NMOSFET Substrate Current Behavior at Accelerated Hot-Carrier Stress Conditions
Lunenborg, M.M., de Graaff, H.C., Mouthaan, A.J., Verweij, J.F.
Published in ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference (01.09.1995)
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Published in ESSDERC '95: Proceedings of the 25th European Solid State Device Research Conference (01.09.1995)
Conference Proceeding
Comprehensive physical modeling of NMOSFET hot-carrier-induced degradation
Lunenborg, M.M., de Graaff, H.C., Mouthaan, A.J., Verweij, J.F.
Published in Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (1996)
Published in Proceedings of the 7th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis (1996)
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Conference Proceeding