Operational Testing of 4H-SiC JFET ICs for 60 Days Directly Exposed to Venus Surface Atmospheric Conditions
Neudeck, Philip G., Chen, Liangyu, Meredith, Roger D., Lukco, Dorothy, Spry, David J., Nakley, Leah M., Hunter, Gary W.
Published in IEEE journal of the Electron Devices Society (01.01.2019)
Published in IEEE journal of the Electron Devices Society (01.01.2019)
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Journal Article
Investigation of Thermal Stability and Degradation Mechanisms in Ni-Based Ohmic Contacts to n-Type SiC for High-Temperature Gas Sensors
Virshup, Ariel, Porter, Lisa M, Lukco, Dorothy, Buchholt, Kristina, Hultman, Lars, Spetz, Anita Lloyd
Published in Journal of electronic materials (01.04.2009)
Published in Journal of electronic materials (01.04.2009)
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Journal Article
4H-SiC Piezoresistive Pressure Sensors at 800 °C With Observed Sensitivity Recovery
Okojie, Robert S., Lukco, Dorothy, Vu Nguyen, Savrun, Ender
Published in IEEE electron device letters (01.02.2015)
Published in IEEE electron device letters (01.02.2015)
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Journal Article
Reliability assessment of Ti/TaSi2/Pt ohmic contacts on SiC after 1000 h at 600 °C
Okojie, Robert S., Lukco, Dorothy, Chen, Yuanliang L., Spry, David J.
Published in Journal of applied physics (15.05.2002)
Published in Journal of applied physics (15.05.2002)
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Journal Article
Prolonged 500 °C Demonstration of 4H-SiC JFET ICs With Two-Level Interconnect
Spry, David J., Neudeck, Philip G., Liangyu Chen, Lukco, Dorothy, Chang, Carl W., Beheim, Glenn M.
Published in IEEE electron device letters (01.05.2016)
Published in IEEE electron device letters (01.05.2016)
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Journal Article
Early Burn-In Parasitic Conduction in 500 °C Durable SiC JFET ICs
Chen, Liang Yu, Neudeck, Philip G., Lukco, Dorothy, Spry, David J.
Published in Key engineering materials (06.06.2023)
Published in Key engineering materials (06.06.2023)
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Journal Article
Oxidation behavior of stainless steels 304 and 316 under the Venus atmospheric surface conditions
Costa, Gustavo C.C., Jacobson, Nathan S., Lukco, Dorothy, Hunter, Gary W., Nakley, Leah, Radoman-Shaw, Brandon G., Harvey, Ralph P.
Published in Corrosion science (01.03.2018)
Published in Corrosion science (01.03.2018)
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Journal Article
Sixty Earth-Day Test of a Prototype Pt/HTCC Alumina Package in a Simulated Venus Environment
Chen, Liangyu, Neudeck, Philip G., Meredith, Roger D., Lukco, Dorothy, Spry, David J., Nakley, Leah M., Phillips, Kyle G., Beheim, Glenn M., Hunter, Gary W.
Published in Journal of microelectronics and electronic packaging (01.04.2019)
Published in Journal of microelectronics and electronic packaging (01.04.2019)
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Journal Article
Prolonged 500°C Operation of 100+ Transistor Silicon Carbide Integrated Circuits
Krasowski, Michael, Chang, Carl W., Neudeck, Philip G., Beheim, Glenn M., Prokop, Norman F., Chen, Liang Yu, Spry, David J., Lukco, Dorothy
Published in Materials science forum (05.06.2018)
Published in Materials science forum (05.06.2018)
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Journal Article
Experimentally observed electrical durability of 4H-SiC JFET ICs operating from 500 °C to 700 °C
Neudeck, Philip G., Spry, David J., Liangyu Chen, Lukco, Dorothy, Chang, Carl W., Beheim, Glenn M.
Published in 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) (15.05.2017)
Published in 2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) (15.05.2017)
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Conference Proceeding
Journal Article
Evidence of Processing Non-Idealities in 4H-SiC Integrated Circuits Fabricated with Two Levels of Metal Interconnect
Neudeck, Philip G., Spry, David J., Evans, Laura J., Lukco, Dorothy, Chang, Carl W., Chen, Liang Yu, Beheim, Glenn M.
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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Journal Article
Processing and Prolonged 500 °C Testing of 4H-SiC JFET Integrated Circuits with Two Levels of Metal Interconnect
Krasowski, Michael, Lukco, Dorothy, Beheim, Glenn M., Spry, David J., Neudeck, Philip G., Chang, Carl W., Prokop, Norman F., Chen, Liang Yu
Published in Materials Science Forum (24.05.2016)
Published in Materials Science Forum (24.05.2016)
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Journal Article
A Novel Tungsten-Nickel Alloy Ohmic Contact to SiC at 900 C
Okojie, Robert S., Evans, Laura J., Lukco, Dorothy, Morris, Joseph P.
Published in IEEE electron device letters (01.08.2010)
Published in IEEE electron device letters (01.08.2010)
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Journal Article
4H-SiC JFET Multilayer Integrated Circuit Technologies Tested up to 1000 K
Spry, David J, Neudeck, Phil G, Chen, Liangyu, Chang, Carl W, Lukco, Dorothy, Beheim, Glenn M.
Published in ECS transactions (21.09.2015)
Published in ECS transactions (21.09.2015)
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Journal Article
Improved Thermal Stability Observed in Ni-Based Ohmic Contacts to n-Type SiC for High-Temperature Applications: Group III Nitrides, SiC and ZnO
VIRSHUP, Ariel, FANG LIU, LUKCO, Dorothy, BUCHHOLT, Kristina, LLOYD SPETZ, Anita, PORTER, Lisa M
Published in Journal of electronic materials (2011)
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Published in Journal of electronic materials (2011)
Journal Article
Novel Carbon Dioxide Microsensor Based on Tin Oxide Nanomaterial Doped With Copper Oxide
Xu, J.C., Hunter, G.W., Lukco, D., Chung-Chiun Liu, Ward, B.J.
Published in IEEE sensors journal (01.03.2009)
Published in IEEE sensors journal (01.03.2009)
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Journal Article
Investigation of Thermal Stability and Degradation Mechanisms in Ni-Based Ohmic Contacts to n-Type SiC for High-Temperature Gas Sensors: Group III Nitrides, SiC, and ZnO
VIRSHUP, Ariel, PORTER, Lisa M, LUKCO, Dorothy, BUCHHOLT, Kristina, HULTMAN, Lars, SPETZ, Anita Lloyd
Published in Journal of electronic materials (2009)
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Published in Journal of electronic materials (2009)
Journal Article
Zero offset drift suppression in SiC pressure sensors at 600 °C
Okojie, Robert S, Lukco, Dorothy, Blaha, Charles, Nguyen, Vu, Savrun, Ender
Published in 2010 IEEE Sensors (01.11.2010)
Published in 2010 IEEE Sensors (01.11.2010)
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Conference Proceeding