by O'Connor, Ian, Mannaa, Sara, Bosio, Alberto, Deveautour, Bastien, Deleruyelle, Damien, Obukhova, Tetiana, Marchand, Cedric, Trommer, Jens, Cakirlar, Cigdem, Wesling, Bruno Neckel, Mikolajick, Thomas, Baumgartner, Oskar, Thesberg, Mischa, Pirker, David, Lenz, Christoph, Stanojevic, Zlatan, Karner, Markus, Larrieu, Guilhem, Pelloquin, Sylvain, Moustakas, Konstantinous, Muller, Jonas, Ansaloni, Giovanni, Amirshahi, Alireza, Atienza, David, Rouas, Jean-Luc, Letaifa, Leila Ben, Bordeall, Georgeta, Brazier, Charles, Mukherjee, Chhandak, Deng, Marina, Wang, Yifan, Francois, Marc, Rezgui, Houssem, Lucas, Reveil, Maneux, Cristell
Published in 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) (25.03.2024)

by Maneux, Cristell, Mukherjee, Chhandak, Deng, Marina, Wesling, Bruno Neckel, Reveil, Lucas, Stanojevic, Zlatan, Baumgartner, Oskar, Larrieu, Guilhem, O'Connor, Ian, Poittevin, Arnaud
Published in 2022 IEEE Latin American Electron Devices Conference (LAEDC) (04.07.2022)

by Reveil, Lucas, Mukherjee, Chhandak, Maneux, Cristell, Deng, Marina, Marc, Francois, Kumar, Abhishek, Lecestre, Aurelie, Larrieu, Guilhem, Poittevin, Arnaud, O'Connor, Ian, Baumgartner, Oskar, Pirker, David
Published in 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC) (03.10.2022)

by Maneux, C., Mukherjee, C., Deng, M., Dubourg, M., Reveil, L., Bordea, G., Lecestre, A., Larrieu, G., Trommer, J., Breyer, E.T., Slesazeck, S., Mikolajick, T., Baumgartner, O., Karner, M., Pirker, D., Stanojevic, Z., Atienza, David, Levisse, A., Ansaloni, G., Poittevin, A., Bosio, A., Deleruyelle, D., Marchand, C., O'Connor, I.
Published in 2021 IEEE International Electron Devices Meeting (IEDM) (11.12.2021)