Analyses on NVM Circuitry Delay Induced by Source & Drain BF2 Implant
Caprara, P., Barcella, A., Beltramello, M., Brambilla, C., Cereda, S., Caimi, C., Contin, V., Daniele, V., Fontana, M., Lucarno, P., Riva, M., Valnegri, M.
Published in Microelectronics and reliability (01.09.2002)
Published in Microelectronics and reliability (01.09.2002)
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Journal Article
Silicon oxynitride study by the tetrahedron model and by spectroscopic ellipsometry
Sassella, A., Lucarno, P., Borghesi, A., Corni, F., Rojas, S., Zanotti, L.
Published in Journal of non-crystalline solids (01.07.1995)
Published in Journal of non-crystalline solids (01.07.1995)
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Conference Proceeding
Analyses on NVM Circuitry Delay Induced by Source & Drain BF 2 Implant
Caprara, P., Barcella, A., Beltramello, M., Brambilla, C., Cereda, S., Caimi, C., Contin, V., Daniele, V., Fontana, M., Lucarno, P., Riva, M., Valnegri, M.
Published in Microelectronics and reliability (2002)
Published in Microelectronics and reliability (2002)
Get full text
Journal Article