Opportunities brought by sequential 3D CoolCube™ integration
Vinet, Maud, Batude, Perrine, Fenouillet-Beranger, Claire, Brunet, Laurent, Mazzochi, Vincent, Lu, Cao-Minh Vincent, Deprat, Fabien, Micout, Jessy, Previtali, Bernard, Besombes, Paul, Rambal, Nils, Andrieu, Francois, Billoint, Olivier, Brocard, Melanie, Thuries, Sebastien, Berhault, Guillaume, Dos Santos, Cristiano Lopes, Cibrario, Gerald, Clermidy, Fabien, Gitlin, Daniel, Faynot, Olivier
Published in 2016 46th European Solid-State Device Research Conference (ESSDERC) (01.09.2016)
Published in 2016 46th European Solid-State Device Research Conference (ESSDERC) (01.09.2016)
Get full text
Conference Proceeding
Integration of Low Temperature SiGe:B Raised Sources and Drains in p-Type FDSOI Field Effect Transistors
Lu, Cao-Minh Vincent, Fenouillet-Beranger, Claire, Hartmann, Jean-Michel, Rodriguez, Philippe, Benevent, Véronique, Samson, Marie-Pierre, Previtali, Bernard, Tabone, Claude, Cassé, Mikael, Allain, Fabienne, Romano, Giovanni, Brunet, Laurent, Batude, Perrine, Skotnicki, Thomas, Vinet, Maud
Published in ECS transactions (18.08.2016)
Published in ECS transactions (18.08.2016)
Get full text
Journal Article
Precise EOT regrowth extraction enabling performance analysis of low temperature extension first devices
Micout, J., Rafhay, Q., Garros, X., Casse, M., Coignus, J., Pasini, L., Lu, C.-M V., Rambal, N., Fenouillet-Beranger, C., Brunet, L., Romano, G., Gassilloud, R., Batude, P., Vinet, M., Ghibaudo, G.
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)
Published in 2017 47th European Solid-State Device Research Conference (ESSDERC) (01.09.2017)
Get full text
Conference Proceeding
Transistor Temperature Deviation Analysis in Monolithic 3D Standard Cells
Brocard, Melanie, Mathieu, Benoit, Colonna, Jean-Philippe, Santos, Cristiano, Fenouillet-Beranger, Claire, Cao-Minh, Vincent Lu, Cibrario, Gerald, Brunet, Laurent, Batude, Perrine, Andrieu, Francois, Thuries, Sebastien, Billoint, Olivier
Published in 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) (01.07.2017)
Published in 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) (01.07.2017)
Get full text
Conference Proceeding
Integration of Low Temperature SiGe:B Raised Sources and Drains in p-Type FDSOI Field Effect Transistors
Lu, Cao-Minh Vincent, Fenouillet-Beranger, Claire, Hartmann, Jean-Michel, Rodriguez, Philippe, Benevent, Véronique, Samson, Marie-Pierre, Previtali, Bernard, Tabone, Claude, Cassé, Mikael, Allain, Fabienne, Romano, Giovanni, Brunet, Laurent, Batude, Perrine, Skotnicki, Thomas, Vinet, Maud
Published in Meeting abstracts (Electrochemical Society) (01.09.2016)
Published in Meeting abstracts (Electrochemical Society) (01.09.2016)
Get full text
Journal Article