by Tsutsui, G., Mochizuki, S., Loubet, N., Bedell, S. W., Sadana, D. K.
Published in AIP Advances (01.03.2019)

by Avenier, G., Diop, M., Chevalier, P., Troillard, G., Loubet, N., Bouvier, J., Depoyan, L., Derrier, N., Buczko, M., Leyris, C., Boret, S., Montusclat, S., Margain, A., Pruvost, S., Nicolson, S.T., Yau, K.H.K., Revil, N., Gloria, D., Dutartre, D., Voinigescu, S.P., Chantre, A.
Published in IEEE journal of solid-state circuits (01.09.2009)

by Nasseri, M., Durfee, C., Li, J., Sieg, K., Schoeche, S., Qin, L., Schmidt, D., Fan, S., Dutta, A., Loubet, N., Miller, E., Meli, L.
Published in 2024 35th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (13.05.2024)

by Breil, N., Lee, B-C., Avendano, J. Avila, Jewell, J., Vellaikal, M., Newman, E., Bazizi, E. M., Pal, A., Liu, L., Gluschenkov, O., Greene, A., Mochizuki, S., Loubet, N., Colombeau, B., Haran, B.
Published in 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (11.06.2023)

by Mochizuki, S., Colombeau, B., Zhang, J., Kung, S. C., Stolfi, M., Zhou, H., Breton, M., Watanabe, K., Li, J., Jagannathan, H., Cogorno, M., Mandrekar, T., Chen, P., Loubet, N., Natarajan, S., Haran, B.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)

by Bao, R., Watanabe, K., Zhang, J., Zhou, H., Sankarapandian, M., Li, J., Pancharatnam, S., Jamison, P., Southwick, R. G, Wang, M., Demarest, J. J, Guo, J., Loubet, N., Basker, V., Guo, D., Narayanan, V., Haran, B., Bu, H., Khare, M.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)

by Fenouillet-Beranger, C., Denorme, S., Perreau, P., Buj, C., Faynot, O., Andrieu, F., Tosti, L., Barnola, S., Salvetat, T., Garros, X., Cassé, M., Allain, F., Loubet, N., Pham-Nguyen, L., Deloffre, E., Gros-Jean, M., Beneyton, R., Laviron, C., Marin, M., Leyris, C., Haendler, S., Leverd, F., Gouraud, P., Scheiblin, P., Clement, L., Pantel, R., Deleonibus, S., Skotnicki, T.
Published in Solid-state electronics (01.07.2009)

by Li, J., Reboh, S., Chao, Robin, Loubet, N., Guillorn, M., Yamashita, T., Gaudiello, J.
Published in Microscopy and microanalysis (01.07.2016)

by Hartmann, J.M., Benevent, V., Barnes, J.P., Veillerot, M., Lafond, D., Damlencourt, J.F., Morvan, S., Prévitali, B., Andrieu, F., Loubet, N., Dutartre, D.
Published in Solid-state electronics (01.05.2013)

by Bhosale, P., Parikh, S., Lanzillo, N., Tao, R., Nogami, T., Gage, M., Shaviv, R., Huang, H., Simon, A., Stolfi, M., Reidy, S., Lee, J., Loubet, N., Haran, B.
Published in 2020 IEEE Symposium on VLSI Technology (01.06.2020)

by Guo, D., Karve, G., Tsutsui, G., Lim, K.-Y, Robison, R., Hook, T., Vega, R., Liu, D., Bedell, S., Mochizuki, S., Lie, F., Akarvardar, K., Wang, M., Bao, R., Burns, S., Chan, V., Cheng, K., Demarest, J., Fronheiser, J., Hashemi, P., Kelly, J., Li, J., Loubet, N., Montanini, P., Sahu, B., Sankarapandian, M., Sieg, S., Sporre, J., Strane, J., Southwick, R., Tripathi, N., Venigalla, R., Wang, J., Watanabe, K., Yeung, C. W., Gupta, D., Doris, B., Felix, N., Jacob, A., Jagannathan, H., Kanakasabapathy, S., Mo, R., Narayanan, V., Sadana, D., Oldiges, P., Stathis, J., Yamashita, T., Paruchuri, V., Colburn, M., Knorr, A., Divakaruni, R., Bu, H., Khare, M.
Published in 2016 IEEE Symposium on VLSI Technology (01.06.2016)

by Li, J., Morin, Pierre, Liu, Q., Cheng, K., Loubet, N., Doris, B., Gaudiello, J.
Published in Microscopy and microanalysis (01.08.2015)

by Loubet, N., Ribe, N. M., Gamblin, Y.
Published in Geochemistry, geophysics, geosystems : G3 (01.10.2009)

by Lauer, Isaac, Loubet, N., Kim, S. D., Ott, J. A., Mignot, S., Venigalla, R., Yamashita, T., Standaert, T., Faltermeier, J., Basker, V., Doris, B., Guillorn, M. A.
Published in 2015 Symposium on VLSI Technology (VLSI Technology) (01.06.2015)

by Li, J., Cheng, K., Khakifirooz, A., Wang, J., Reznicek, A., Madan, A., Dons, B., Loubet, N., He, H., Gaudiello, J.
Published in Microscopy and microanalysis (01.08.2014)

by Khakifirooz, A., Cheng, K., Nagumo, T., Loubet, N., Adam, T., Reznicek, A., Kuss, J., Shahrjerdi, D., Sreenivasan, R., Ponoth, S., He, H., Kulkarni, P., Liu, Q., Hashemi, P., Khare, P., Luning, S., Mehta, S., Gimbert, J., Zhu, Y., Zhu, Z., Li, J., Madan, A., Levin, T., Monsieur, F., Yamamoto, T., Naczas, S., Schmitz, S., Holmes, S., Aulnette, C., Daval, N., Schwarzenbach, W., Nguyen, B.-Y, Paruchuri, V., Khare, M., Shahidi, G., Doris, B.
Published in 2012 Symposium on VLSI Technology (VLSIT) (01.06.2012)

by Loubet, N., Kal, S., Alix, C., Pancharatnam, S., Zhou, H., Durfee, C., Belyansky, M., Haller, N., Watanabe, K., Devarajan, T., Zhang, J., Miao, X., Sankar, M., Breton, M., Chao, R., Greene, A., Yu, L., Frougier, J., Chanemougame, D., Tapily, K., Smith, J., Basker, V., Mosden, A., Biolsi, P., Hurd, T. Q., Divakaruni, R., Haran, B., Bu, H.
Published in 2019 IEEE International Electron Devices Meeting (IEDM) (01.12.2019)

by Monfray, S., Fenouillet-Beranger, C., Bidal, G., Boeuf, F., Denorme, S., Huguenin, J.L., Samson, M.P., Loubet, N., Hartmann, J.M., Campidelli, Y., Destefanis, V., Arvet, C., Benotmane, K., Clement, L., Faynot, O., Skotnicki, T.
Published in Solid-state electronics (01.02.2010)

by Huguenin, J.L., Bidal, G., Denorme, S., Fleury, D., Loubet, N., Pouydebasque, A., Perreau, P., Leverd, F., Barnola, S., Beneyton, R., Orlando, B., Gouraud, P., Salvetat, T., Clement, L., Monfray, S., Ghibaudo, G., Boeuf, F., Skotnicki, T.
Published in Solid-state electronics (01.09.2010)

by Mendoza, B., L'Herron, B., Loubet, N., Fronheiser, J., Reznicek, A., Gaudiello, J., Gin, P., Matney, K. M., Wall, J., Ryan, P., Wormington, M.
Published in 2016 27th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) (01.05.2016)